Abstract:The authors demonstrate for the first time the injection of electrons across an n-type to p-type silicon junction and their subsequent tunneling from approximately 1 μm tall p-type silicon points into a vacuum gap. The diffusive flow of these minority carriers in the p-type material is controlled by the application of a bias voltage in the form of a base contact metallization contact on the p-type silicon, in analogy with a bipolar junction transistor. Using an array density of 4×106 tips/cm2, the authors meas… Show more
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