2008
DOI: 10.1380/ejssnt.2008.54
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Electron Emission from Insulators Irradiated by Slow Highly Charged Ions

Abstract: Total electron emission yields have been measured for the first time resulting from impact of slow highly charged Arq+ (q ≤ 17), Xeq+ (q ≤ 50) and Hgq+ (q ≤ 68) ions on clean insulating LiF(001) and CaF2(111) surfaces at various impact angles. The surprisingly large yields show that even for the highest projectile charge states, a local charge-up of the surface poses no barrier for electron emission. We demonstrate that this is due to a strong sub-surface contribution in the potential electron emission process… Show more

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Cited by 25 publications
(20 citation statements)
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“…The electron yields for all insulating targets show a rather high contribution of kinetic electron emission compared to the metallic surface of Au, reproducing the findings in [18].…”
Section: Secondary Electron Emissionsupporting
confidence: 83%
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“…The electron yields for all insulating targets show a rather high contribution of kinetic electron emission compared to the metallic surface of Au, reproducing the findings in [18].…”
Section: Secondary Electron Emissionsupporting
confidence: 83%
“…(5) and (6) nicely reproduce the yields on the insulating surfaces down to velocities as low as 3:5 Â 10 4 m/s (E kin ¼ 20 eV/Q), more than one order of magnitude below the velocities accessible in [18]. Thus, it seems that the proposed mechanisms of increased contribution of sub-surface created electrons for insulators hold promise even at lowest projectile velocities.…”
Section: Secondary Electron Emissionmentioning
confidence: 64%
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