1999
DOI: 10.1088/0953-8984/11/5/004
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Electron-drag effects in coupled electron systems

Abstract: The advancement of fabrication and lithography techniques of semiconductors have made it possible to study bi-layer systems made of two electronic layers separated by distances of several hundred Angstroms. In this situation the electrons in layer 1 are distinguishable from those in layer 2, and can communicate through the direct inter-layer Coulomb interaction. In particular, if a current is applied to one of the layers, the electrons in the second will be dragged giving rise to a transresistance ρ D . In thi… Show more

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Cited by 165 publications
(200 citation statements)
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“…47 to include effects due to the finite width of the GaAs quantum well (see Supplementary Note 4). This shows that the experimental results in this temperature range are consistent with the canonical Fermi-liquid prediction 24,[43][44][45][46][47][48][49][50] , that is, R D pT 2 (see also Fig. 3a), as constrained by the available phase-space of the initial and final states involved in the scattering process.…”
Section: Resultssupporting
confidence: 80%
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“…47 to include effects due to the finite width of the GaAs quantum well (see Supplementary Note 4). This shows that the experimental results in this temperature range are consistent with the canonical Fermi-liquid prediction 24,[43][44][45][46][47][48][49][50] , that is, R D pT 2 (see also Fig. 3a), as constrained by the available phase-space of the initial and final states involved in the scattering process.…”
Section: Resultssupporting
confidence: 80%
“…We focus on the Coulomb drag transport measurements, which are sensitive to many-body effects. We find that the Coulomb drag resistivity significantly increases for temperatures To5-10 K, with a notable departure from the T 2 temperature dependence expected in a weakly correlated Fermi-liquid scenario 24 . The low-temperature data follow a logarithmic law, without the onset of saturation in the case of bilayer graphene/GaAs samples.…”
mentioning
confidence: 56%
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“…The drag effect complements and enriches the traditional experimental methods and in the last decade has proved to be a powerful tool to probe interlayer electron-electron ͑e-e͒ interaction. 5 Recently the drag measurements have been extended to the limit of very low carrier concentrations. The dimensionless parameter r s = ͱ 2/͑k F a B * ͒, which describes the carrier density n and measures the strength of the electron-electron interaction, 6 varies approximately from 10 to 20 in the experiment on hole samples by Pillarisetty et al 7,8 Here k F = ͱ 2 n is the Fermi wave vector, and a B * = ប 2 0 / m * e 2 is the effective Bohr radius, with 0 the static dielectric constant and m * the effective mass of the carriers; a B * = 9.79 and 3.45 nm, respectively, in the conduction ͑m e * = 0.067m 0 ͒ and valence ͑m h * = 0.19m 0 ͒ bands of GaAs.…”
Section: Introductionmentioning
confidence: 99%