2016
DOI: 10.1103/physrevlett.117.147002
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Electron Doping of the Parent CuprateLa2CuO4without Cation Substitution

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Cited by 24 publications
(24 citation statements)
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“…1(a)]-corresponds to a filling of 15% electron doping. While there have been extensive reports on additional electron doping by reduction annealing of electron-doped cuprates [20,[29][30][31][32][33], this filling is consistent with the nominal Ce concentration.…”
Section: Resultssupporting
confidence: 70%
“…1(a)]-corresponds to a filling of 15% electron doping. While there have been extensive reports on additional electron doping by reduction annealing of electron-doped cuprates [20,[29][30][31][32][33], this filling is consistent with the nominal Ce concentration.…”
Section: Resultssupporting
confidence: 70%
“…The successful synthesis of undoped T superconductors has brought this question to the fore. A number of recent experimental investigations [68][69][70] have confirmed that reduction annealing by removing apical oxygens severely reduces the stability of the AFM phase and introduces additional carriers by some mechanism that is as yet not understood. The actual carrier density even in conventional materials is different from what would be guessed from the Ce concentration alone 68,70 .…”
Section: A Experimental Puzzles: Electron-doped Materialsmentioning
confidence: 99%
“…Moreover, the oxygen nonstoichiometry should affect the carrier concentration and the oxygen axis is thus coupled to the doping axis. Indeed, there are recent reports on angle resolved photoemission spectroscopy (ARPES) investigations of Pr 1.3 La 0.6 Ce 0.1 CuO 4−δ single crystal and T 0 -La 2 CuO 4 thin film which reveal that annealing and oxygen vacancy induce a sufficient change in the carrier density [22,23]. These results clearly indicate that the doping should be considered in conjunction with the annealing and oxygen nonstoichiometry and that the actual electron concentration n, instead of the Ce concentration x, should be used in building the phase diagram.…”
mentioning
confidence: 99%