Electron diffraction study of the short-range order in glasses of the system TeO2B2O3

Microstructure, decomposition, and crystallization inZr41Ti14CuWang1, Wei2, Friedrich3 1998Phys. Rev. B1151360View full textAdd to dashboardCite

“…Electron-diffraction intensity analysis with imagingplate ͑IP͒ technique is one way to overcome this difficulty, and this method has been developed for obtaining RDF from amorphous materials in recent years. [14][15][16] It has a number of advantages over x-ray and neutron-diffraction techniques for the structural investigation of amorphous materials. The most important of these is the large scattering cross section that permits rapid data collection with good statistics.…”

Microstructure studies of Zr41Ti14Cu12.5Ni10Be22.5 bulk amorphous alloy by electron diffraction intensity analysis

“…[12][13][14][15] This method has a number of advantages over the x-ray diffraction and neutron diffraction techniques for the structural investigation of the a-alloys. The most important of them is the large scattering cross section which permits rapid data collection with good statistics.…”

“…The most important of them is the large scattering cross section which permits rapid data collection with good statistics. 13 The IP technique 15 makes it possible to measure the electron diffraction intensity correctly because of its wide dynamic range and excellent linearity for electron intensity. In this work, electron diffraction intensity analysis with the IP technique is applied for obtaining RDF from the a-alloy Zr 41 Ti 14 Cu 12.5 Ni 10 Be 22.5 .…”

Calculation and analysis of vibrational spectra of PbCl2–Sb2O3–TeO2 glass from first principles

“…The above analysis of vibrational modes is presented in Figs. [11][12][13][14] and is based on that proposed in the paper [30].…”

“…The structure of tellurite glasses is studied by available techniques, in particular by diffraction methods [12][13][14], by EXAFS [15] or by Raman spectroscopy [16], but each of these experimental methods provides only partial structural information.…”