2010
DOI: 10.1002/ctpp.200900023
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Electron Density Profile Measurement in Heliotron J with a Microwave AM Reflectometer

Abstract: A microwave reflectometer is developed for electron density profile measurement in Heliotron J. An amplitude modulation (AM) type system is adopted to reduce density fluctuation effects. The carrier frequency ranges from 33 to 56 GHz, and the modulation frequency is 200 MHz. The X-mode is selected as the propagation mode in order to measure a hollow density profile which is typically observed in ECH plasmas. A test-bench examination using an aluminum reflection plate shows that the measured phase shift agrees … Show more

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Cited by 3 publications
(2 citation statements)
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“…It clearly shows the stabilization comparing with the solution in Eq. (5). Errors in (U TÑ ) i are not propagated with the factors 1/ w i , but only with the factors w i /(w i 2 + mγ ) into the solution.…”
Section: A Svd-gcv Methodsmentioning
confidence: 99%
“…It clearly shows the stabilization comparing with the solution in Eq. (5). Errors in (U TÑ ) i are not propagated with the factors 1/ w i , but only with the factors w i /(w i 2 + mγ ) into the solution.…”
Section: A Svd-gcv Methodsmentioning
confidence: 99%
“…The density is saturated at 1.4 × 10 19 m −3 and starts to decrease at about 15 ms after SMBI. The density profile for these two discharges is measured with a microwave reflectmeter [13] at #15.5 section. In the open shutter case, the density profile, which is rather flat before SMBI, rapidly changes to a peaked one after SMBI, while the profile change is slow and mild in the closed shutter case [14] .…”
Section: Effects Of Smbi Fuelingmentioning
confidence: 99%