2008
DOI: 10.12693/aphyspola.113.825
|View full text |Cite
|
Sign up to set email alerts
|

Electron Charge Noise Minimization in 130 nm CMOS Preamplifiers

Abstract: In this paper we present the design aspects for low-power, low-noise CMOS charge sensitive preamplifier that uses a leakage current compensation circuit for use with radiation sensors. The preamplifier has unipolar response with the peaking time of about 45 ns and the gain about 115-145 mV/ke. Equivalent noise charge (ENC) is less than 80 e, when the input charge is 1-20 ke and the sensors capacitance is equal to 30 fF. In this work we present the quality function of the charge sensitive preamplifier, which ch… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2009
2009
2013
2013

Publication Types

Select...
1
1

Relationship

1
1

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 4 publications
(6 reference statements)
0
1
0
Order By: Relevance
“…The amplifier design is critical since it should match the detector interface. The front--end chips are fabricated in state-of-the-art industrial silicon CMOS or GaAs MESFET processes [3,4]. This allows more logic to be introduced into a pixel or the use of a smaller pixel size.…”
Section: Introductionmentioning
confidence: 99%
“…The amplifier design is critical since it should match the detector interface. The front--end chips are fabricated in state-of-the-art industrial silicon CMOS or GaAs MESFET processes [3,4]. This allows more logic to be introduced into a pixel or the use of a smaller pixel size.…”
Section: Introductionmentioning
confidence: 99%