1992
DOI: 10.1080/01418619208201567
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Electron channelling contrast as a supplementary method for microstructural investigations in deformed metals

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Cited by 104 publications
(42 citation statements)
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“…The incident electron beam is along o1104, the normal direction of the specimen. Unlike the ECC observation on materials with low dislocation density 42 , the diffraction conditions could be relaxed in the present study in detecting the fatigued dislocation arrangements [43][44][45][46] . The working distance is about 8 mm and the acceleration voltage is 20 kV using an aperture of 60 mm.…”
Section: Methodsmentioning
confidence: 95%
“…The incident electron beam is along o1104, the normal direction of the specimen. Unlike the ECC observation on materials with low dislocation density 42 , the diffraction conditions could be relaxed in the present study in detecting the fatigued dislocation arrangements [43][44][45][46] . The working distance is about 8 mm and the acceleration voltage is 20 kV using an aperture of 60 mm.…”
Section: Methodsmentioning
confidence: 95%
“…The group of Mughrabi and co-workers [29][30][31] published the first papers on this subject. The authors give an overview on results of the first ECCI investigations on different types of materials after cyclic deformation like austenitic steel, copper and α-iron [30]. A direct comparison of dislocation arrangements imaged both by applying conventional TEM as well as ECCI in a SEM with tungsten cathode and low-tilt ECCI configuration (tilt angle ≤10°) is presented.…”
Section: Imaging Of Dislocation Arrangements After Fatiguementioning
confidence: 99%
“…The <221> samples plate-impacted at 57 GPa were full of large recrystallized grains, which were shown by both TEM and SEM -Electron Channeling Contrast [36] in Figures 8 (a) and (b). Annealing twins grow in the recrystallized grains.…”
mentioning
confidence: 97%