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2004
DOI: 10.1016/j.surfcoat.2004.04.007
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Electron-beam-generated plasmas for materials processing

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Cited by 64 publications
(32 citation statements)
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“…14 Also, unlike other plasma sources, species production rates are nearly directly proportional to the background gas concentrations 14 and can thus be easily adjusted; the total production rate can be changed by varying the beam current density. 15 Lastly and importantly for this work, the plasma electron temperature is inherently low, which provides a low plasma potential, and thus, low ion energy as they leave the plasma.…”
Section: Introductionmentioning
confidence: 99%
“…14 Also, unlike other plasma sources, species production rates are nearly directly proportional to the background gas concentrations 14 and can thus be easily adjusted; the total production rate can be changed by varying the beam current density. 15 Lastly and importantly for this work, the plasma electron temperature is inherently low, which provides a low plasma potential, and thus, low ion energy as they leave the plasma.…”
Section: Introductionmentioning
confidence: 99%
“…The ribbon electron beam was produced by a forevacuum plasma electron source [18]. The source was specially designed for ribbon beam generating while transmission without traditionally used [15,19,20] longitudinal magnetic field. The source represented a three-electrode system -hollow cathode 1, flat anode 2 and extractor 3 (Fig.…”
Section: Methodsmentioning
confidence: 99%
“…The works [14,15] describe effective usage of plasma cathode electron sources for generating large-area beam plasma. Control of energy spectrum of plasma ion flow in the mentioned works was performed by putting negative bias on the target.…”
Section: Introductionmentioning
confidence: 99%
“…Figure 8 shows the relative flux of ions at an electrode located various distances from the beam axis. 32 In this case, the flux is normalized to the total flux of all ions, which decays according to the profile in Figure 7. Taken together, the results of Figures 7 and 8 show that it is possible to control both the total flux and importantly, the relative flux ratios (in this case, Ar + :N 2 + :N + ) by adjusting the beam-to-wafer standoff.…”
Section: Armentioning
confidence: 99%
“…Both techniques have been applied to electron beam generated plasmas and examples are shown in Figures 13 and 14. Figure 13 shows the N + ion energy distributions measured at a ground stage while biasing the beam dump, 32 an alternative approach 52 that effectively elevates the plasma potential to produce a sheath drop at the surface whose magnitude is equivalent to negatively biasing the electrode. The majority of the incoming ions impact the electrode with energies slightly above the bias value (and thus comparable to the plasma potential in the absence of an applied bias), suggesting that N + ions suffer few collisions while crossing the sheath.…”
Section: Controlling the Ion Energy At Surfacesmentioning
confidence: 99%