2016
DOI: 10.1088/1742-6596/732/1/012011
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Electron beam diagnostics tool based on Cherenkov radiation in optical fibers

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Cited by 4 publications
(3 citation statements)
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“…For example, the feasibility of transverse electron beam profile measurements for a few MeV energy and low intensity beams using CR generated in a bulk of optical fibers was demonstrated in experiments presented in. 14) The main advantage of this technique is the perpendicular orientation of the fiber relative to the electron beam propagation direction. It means that there are no distortions of experimental results in comparison with the case when the fiber is inclined at the Cherenkov angle.…”
Section: Introductionmentioning
confidence: 99%
“…For example, the feasibility of transverse electron beam profile measurements for a few MeV energy and low intensity beams using CR generated in a bulk of optical fibers was demonstrated in experiments presented in. 14) The main advantage of this technique is the perpendicular orientation of the fiber relative to the electron beam propagation direction. It means that there are no distortions of experimental results in comparison with the case when the fiber is inclined at the Cherenkov angle.…”
Section: Introductionmentioning
confidence: 99%
“…Clinical imaging of radiotracers takes advantage of Cherenkov light, and provides a compliment to positron emission tomography imaging [10]. Electron beam relative dosimetry has also been performed using Cherenkov light and showed favorable results [11] [12]. However, when a separate light source is being measured (for example in scintillator dosimetry) any Cherenkov light generated will contaminate the light signal intended to be measured.…”
Section: Introductionmentioning
confidence: 99%
“…For example, this type of radiation occurs when the Coulomb field of a relativistic charge interacts with dielectric fiber. The optical fibers, in which radiation is generated by passing a charged particle through fiber material, have been already applied for the beam loss monitors [4,5] and for transverse beam profile diagnostics [6,7]. Essential restriction on the application of optical fibers for beam diagnostics is fiber optical property modification induced by the electron beam.…”
Section: Introductionmentioning
confidence: 99%