Electron beam damage in oxides: a review

Jiang, Nan

doi:10.1088/0034-4885/79/1/016501

Cited by 231 publications

(262 citation statements)

References 212 publications

(410 reference statements)

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“…During these processes, beam damage can occur, in which the composition, oxidation state or bonding environment are changed during the measurement. 122,125 Figure 3. Common techniques for measuring composition, classified based on whether they are surface sensitive, measure the bulk of the film or either.…”

Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning

confidence: 99%

“…These 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 include controlling the acceleration voltage of the probe beam, reducing the flux of the beam by defocusing, reducing beam exposure time through rastering, using different particles for the probe beam, adjusting specimen orientation and thickness, or adjusting the wavelength of the probe beam. 117,120,122,125 In all cases, evidence should be given that the composition measurements are reflective of the original sample. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 ...…”

Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning

confidence: 99%

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Perovskite-Inspired Photovoltaic Materials: Toward Best Practices in Materials Characterization and Calculations

et al. 2017

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ABSTRACT:Recently, there has been an explosive growth in research based on hybrid lead-halide perovskites for photovoltaics owing to rapid improvements in efficiency. The advent of these materials for solar applications has led to widespread interest in understanding the key enabling properties of these materials. This has resulted in renewed interest in related compounds and a search for materials that may replicate the defect-tolerant properties and long lifetimes of the hybrid lead-halide perovskites. Given the rapid pace of development of the field, the rises in efficiencies of these systems have outpaced the more basic understanding of these materials. Measuring or calculating the basic properties, such as crystal/electronic structure and composition, can be challenging because some of these materials have anisotropic structures, and/or are composed of both heavy metal cations and volatile, mobile, light elements. Some consequences are beam damage during characterization, composition change under vacuum, or compound effects, such as the alteration of the electronic structure through the influence of the substrate. These effects make it challenging to understand the basic properties integral to optoelectronic operation. Compounding these difficulties is the rapid pace with which the field progresses. This has created an ongoing need to continually evaluate best practices with respect to characterization and calculations, as well as to identify inconsistencies in reported values to determine if those inconsistencies are rooted in characterization methodology or materials synthesis. This article describes the difficulties in characterizing hybrid lead-halide perovskites and new materials, and how these challenges may be overcome. 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 2 challenges discussed. The focus in this article is on crystallography, composition measurements, photoemission spectroscopy and calculations on perovskites and new, related absorbers. We suggest how some of the important artifacts could be avoided and how the reporting for each technique could be streamlined between groups to ensure reproducibility as the field progresses.

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Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning

confidence: 99%

Section: Page 10 Of 39 Acs Paragon Plus Environment Chemistry Of Matementioning

confidence: 99%

Perovskite-Inspired Photovoltaic Materials: Toward Best Practices in Materials Characterization and Calculations

et al. 2017

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“…High-energy electron beams, which are focused down to a spot that is several nanometers in size, may cause local heating, electrostatic charging, and material structural damage [32][33][34]; these alter the sample properties and may reduce the performance of the final device. The level of introduced defects depends on the beam energy, accumulated dose, and scattering cross-sections of the accelerated particles.…”

Section: Limits Of Materials Modification/damagementioning

confidence: 99%

Tipping solutions: emerging 3D nano-fabrication/ -imaging technologies

et al. 2017

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The evolution of optical microscopy from an imaging technique into a tool for materials modification and fabrication is now being repeated with other characterization techniques, including scanning electron microscopy (SEM), focused ion beam (FIB) milling/imaging, and atomic force microscopy (AFM). Fabrication and in situ imaging of materials undergoing a three-dimensional (3D) nano-structuring within a 1−100 nm resolution window is required for future manufacturing of devices. This level of precision is critically in enabling the cross-over between different device platforms (e.g. from electronics to micro-/ nano-fluidics and/or photonics) within future devices that will be interfacing with biological and molecular systems in a 3D fashion. Prospective trends in electron, ion, and nano-tip based fabrication techniques are presented.

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“…Radiolytic damage originates from inelastic interactions between the incident beam and electrons within the specimen, in which the potential energy of an excited atomic state is converted into atomic displacement. A more complete discussion on damage mechanisms has been reviewed elsewhere [1-4]. …”

Section: Introductionmentioning

confidence: 99%

Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope

et al. 2016

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Beam damage caused by energetic electrons in the transmission electron microscope is a fundamental constraint limiting the collection of artifact-free information. Through understanding the influence of the electron beam, experimental routines may be adjusted to improve the data collection process. Investigations of CeO2 indicate that there is not a critical dose required for the accumulation of electron beam damage. Instead, measurements using annular dark field scanning transmission electron microscopy and electron energy loss spectroscopy demonstrate that the onset of measurable damage occurs when a critical dose rate is exceeded. The mechanism behind this phenomenon is that oxygen vacancies created by exposure to a 300 keV electron beam are actively annihilated as the sample re-oxidizes in the microscope environment. As a result, only when the rate of vacancy creation exceeds the recovery rate will beam damage begin to accumulate. This observation suggests that dose-intensive experiments can be accomplished without disrupting the native structure of the sample when executed using dose rates below the appropriate threshold. Furthermore, the presence of an encapsulating carbonaceous layer inhibits processes that cause beam damage, markedly increasing the dose rate threshold for the accumulation of damage.

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Electron beam damage in oxides: a review

Cited by 231 publications

References 212 publications

Perovskite-Inspired Photovoltaic Materials: Toward Best Practices in Materials Characterization and Calculations

Perovskite-Inspired Photovoltaic Materials: Toward Best Practices in Materials Characterization and Calculations

Tipping solutions: emerging 3D nano-fabrication/ -imaging technologies

Dose-rate-dependent damage of cerium dioxide in the scanning transmission electron microscope

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