Electron attachment to hexafluoropropylene oxide (HFPO)

Zawadzki, Mateusz; Chachereau, Alise; Kočišek, Jaroslav; Franck, Christian M.; Fedor, Juraj

doi:10.1063/1.5051724

Cited by 15 publications

(8 citation statements)

References 26 publications

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“…This process, known as dissociative electron attachment (DEA), has been reported for halogen-containing molecules and in particular for trifluoroacetic acid. [65][66][67][68][69] The resultant fragments would be F À and a difluoroacetyl radical (process (ii) in Scheme 2). Although a detailed structure of the final product cannot be inferred, XPS studies have clearly shown the presence of new F À species in the thin film after EUV exposure.…”

Section: Resultsmentioning

confidence: 99%

Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography

et al. 2020

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Section: Resultsmentioning

confidence: 99%

Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography

et al. 2020

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“…The errorbars shown with our experimental data express these values (only for some measurement points the uncertainty from the fitting procedure exceeds this value) which results in the slightly bigger errorbars for these cases. The PT experiment has already been described in detail in previous works [36,37], and has been used to obtain electron and ion swarm parameters in many fluorinated gases and gas mixtures [46][47][48][49][50][51][52][53][54][55][56][57][58][59] as well as in Ar, N 2 , CO 2 , O 2 , N 2 O and mixtures of those [36,37,[60][61][62][63].…”

Section: Data Acquisitionmentioning

confidence: 99%

Electron transport parameters in CO₂: a comparison of two experimental systems and measured data

Vass

Egüz

Chachereau

et al. 2020

J. Phys. D: Appl. Phys.

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Two experimental apparatuses used to obtain electron transport coefficients in gases are compared based on measurements in CO2 over a wide range of E/N-values. The operation principles of the two experimental systems as well as their data acquisition methods are different. One operates under the time of flight (TOF) principle, where the transport coefficients are obtained by fitting the theoretical form of the electron density of a swarm in an unbounded region, n(x, t), to the measured current at different values of the drift length, I(L, t). The other experimental apparatus operates in the Pulsed Townsend (PT) mode, where the electron transport coefficients are obtained by fitting the spatial integral of n(x, t) over the drift region to the measured, time-dependent current signal, I(t). In both apparatuses, the measured E/N range was extended as much as possible to allow a large overlap for the comparison of the results. The bulk drift velocity, W, obtained by the two systems agrees well (within a few %) over a wide range of E/N values (100 Td ≤ E/N ≤ 1000 Td). The agreement between the data sets for the longitudinal component of the bulk diffusion tensor, D L , is less satisfactory, the TOF data show systematically higher values (by 10–50% depending on E/N) than the PT measurements. Significant differences are also found below 100 Td in case of the effective ionisation frequency, ν e f f , and the (steady state) Townsend ionisation coefficient, α e f f , where the TOF apparatus is unable to give accurate results. Our comparison justifies the correctness of the measured data over the range of agreement and also indicates the interval in E/N where the data obtained by each of the experimental systems can be taken to be reliable. The limits of the operating regimes of the two setups, stemming from the hardware and from the physical limits, are discussed.

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“…C 5 F 10 Odoes not show up in figure 3(b). Zawadzki also did not detect the parent anion C 3 F 6 Oin the mass spectrum of C 3 F 6 O within EAMS [36]. Then, we detected the density of C 5 F 10 Owith different electron energies in EAMS, as shown in figure 5(b).…”

Section: Methodsmentioning

confidence: 77%

Detection and analysis of spark discharge products of C₅F₁₀O by electron attachment mass spectrometry

Wang¹,

Ma²,

Liu³

et al. 2020

J. Phys. D: Appl. Phys.

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C 5 F 10 O has the potential to replace SF 6 as an insulation gas in switchgears due to its high breakdown field strength and low global warming potential. However, as a newly synthesized gas, the chemical characteristics of C 5 F 10 O are not well known. In particular, the discharge products of C 5 F 10 O are not clear, which limits its insulating capability evaluation in long-term use, and further hinders the development of a gas sensor to monitor the insulation deterioration of C 5 F 10 O-containing switchgears. In this paper, electron attachment mass spectrometry (MS) was proposed to detect the decomposed products of C 5 F 10 O under pulsed spark discharge condition. It was found that the ionization source of the MS had an optimal electron energy of 2 eV to avoid decomposing the gas molecules to be detected while having a high detection sensitivity. The detected discharge products mainly included CF

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Electron attachment to hexafluoropropylene oxide (HFPO)

Cited by 15 publications

References 26 publications

Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography

Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography

Electron transport parameters in CO₂: a comparison of two experimental systems and measured data

Detection and analysis of spark discharge products of C₅F₁₀O by electron attachment mass spectrometry

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Electron attachment to hexafluoropropylene oxide (HFPO)

Cited by 15 publications

References 26 publications

Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography

Mixed-ligand zinc-oxoclusters: efficient chemistry for high resolution nanolithography

Electron transport parameters in CO2: a comparison of two experimental systems and measured data

Detection and analysis of spark discharge products of C5F10O by electron attachment mass spectrometry

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Electron transport parameters in CO₂: a comparison of two experimental systems and measured data

Detection and analysis of spark discharge products of C₅F₁₀O by electron attachment mass spectrometry