2012
DOI: 10.1021/jp306843a
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Electron Attachment to C7F14, Thermal Detachment from C7F14, the Electron Affinity of C7F14, and Neutralization of C7F14 by Ar+

Abstract: Rate coefficients and branching fractions have been measured for electron attachment to perfluoromethylcyclohexane, C(7)F(14), along with thermal detachment rate coefficients for C(7)F(14)(-), from 300 to 630 K, using a flowing-afterglow Langmuir-probe apparatus. The attachment rate coefficient at room temperature is 4.5 ± 1.2 × 10(-8) cm(3) s(-1) and increases with temperature at a rate described by an activation energy of 50 ± 25 meV. Thermal electron detachment is negligible at room temperature, but measura… Show more

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Cited by 9 publications
(19 citation statements)
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“…Above 400K, the fragment ions increase and become the dominant ions in the 4.5 ms data by 630K. The parent negative ion intensity in the 4.5 ms data is over 99% at 600K and decreases to about 10% at 620K …”
Section: Resultsmentioning
confidence: 97%
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“…Above 400K, the fragment ions increase and become the dominant ions in the 4.5 ms data by 630K. The parent negative ion intensity in the 4.5 ms data is over 99% at 600K and decreases to about 10% at 620K …”
Section: Resultsmentioning
confidence: 97%
“…Barrera demonstrated that the API-NIMS data was consistent with an AE a (C 7 F 14 ) of 1.06(10) eV. [10][11][12]16,17] Miller and co-workers determined the (flowing afterglow [19] ) FLAG-12, AE a (C 7 F 14 ), 1.02(6) eV, increasing the precision of the TCT [16] and ECD values. [19] In 1991, Mock and Grimsrud reported photodetachment onsets of C 7 F 14 and SF 6 anions at atmospheric pressure, 3.3 eV, consistent with the 1979 study of electron attachment at 3500K indicating equal gs-AE a (C 7 F 14 ) and gs-AE a (SF 6 ).…”
mentioning
confidence: 91%
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