Electron Attachment in C8F16O

Abstract

The negative ion spectrum of C8F16O6 at low electron energies has been obtained using the mass spectrometer. The most intense peaks are identified as C8F16O—, C7F14—, C5F9O—, C4F8O—, C4F7O—, C3F6O—, and CF3O— ions. Formation of the CF3O— ion requires a rearrangement process. Appearance potentials and attachment energy ranges of the most intense peaks are given. Positive and negative ion fragmentation of the molecule is discussed relative to the components of the mixture, perfluoro-2-butyltetrahydrofuran and perfluoro-2-propyltetrahydropyran and its separation.

Negative ion mass spectrometry

“…A high-energy process (~10 eV) for CF3O-formation has been observed, and a secondary electron capture process has been suggested117 similar to that noted in C2F6.108 A measure of the abundance of negative ions and appearance potentials in C8Fi60 compounds has led to an identification of fiveand six-membered ring components which were separated by gas chromatography. 118 The fragmentation of perfluoro-2-pyran (A) and furan (B) compounds were considered.…”