1995
DOI: 10.1063/1.113806
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Electron and hole mobility in tris(8-hydroxyquinolinolato-N1,O8) aluminum

Abstract: We have measured the drift mobility of electrons and holes in thin, vapor-deposited films of tris(8-hydroxyquinolinolato-N1,O8) aluminum using a time of flight photoconductivity technique. The drift of mobility of both carriers is dispersive and strongly electric field and temperature dependent. At ambient temperature and an electric field of 4×105 V cm−1, the effective mobility of electrons and holes is 1.4×10−6 and 2×10−8 cm2 V−1 s−1, respectively, in a 400 nm thick sample.

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Cited by 412 publications
(183 citation statements)
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“…The increased onset voltage and decreased OMAR can be rationalized considering the increase in the electroninjection barrier and the resulting increase of the interface resistance, respectively, when using high work function cathodes (Ca has the lowest work-function, followed by Al, whereas Au has one of the largest work functions). This strong dependence of OMAR in Alq 3 on the choice of cathode material was to be expected since the hole mobility is about 100 times smaller than the electron mobility [24] in Alq 3 .…”
Section: B Organic Magnetoresistance In Small Molecule Devicesmentioning
confidence: 99%
“…The increased onset voltage and decreased OMAR can be rationalized considering the increase in the electroninjection barrier and the resulting increase of the interface resistance, respectively, when using high work function cathodes (Ca has the lowest work-function, followed by Al, whereas Au has one of the largest work functions). This strong dependence of OMAR in Alq 3 on the choice of cathode material was to be expected since the hole mobility is about 100 times smaller than the electron mobility [24] in Alq 3 .…”
Section: B Organic Magnetoresistance In Small Molecule Devicesmentioning
confidence: 99%
“…This form for the mobility has been seen in time of flight measurements on conjugated organic materials, and has been derived theoretically. [13][14][15][16][17][18][19] It has been directly seen in time of flight measurements of MEH-PPV. 20 The device fabrication has been described previously.…”
Section: Introductionmentioning
confidence: 99%
“…When a positive voltage was applied for these devices, the bright green electroluminescence of Alq 3 was observed with an emission maximum at around 520 nm. [25,26] This implies that the hole mobility in the HTL of 8-10 was fully sufficient for an effective charge carrier recombination occurring within the Alq 3 layer. An exciplex formation at the interface between HTL and Alq 3 layer was not observed after several minutes of the operation of the devices.…”
Section: Resultsmentioning
confidence: 98%