2018
DOI: 10.1103/physreva.97.053415
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Electron and fluorescence spectra of a water molecule irradiated by an x-ray free-electron laser pulse

Abstract: With the highly intense x-ray light generated by x-ray free-electron lasers (XFELs), molecular samples can be ionized many times in a single pulse. Here we report on a computational study of molecular spectroscopy at the high x-ray intensity provided by XFELs. Calculated photoelectron, Auger electron, and x-ray fluorescence spectra are presented for a single water molecule that reaches many electronic hole configurations through repeated ionization steps. The rich details shown in the spectra depend on the x-r… Show more

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Cited by 10 publications
(9 citation statements)
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References 54 publications
(97 reference statements)
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“…1. In the low-fluence case (a), it is noticeable that the number of Auger decays decreases as the pulse duration becomes shorter, which is consistent with the observation in [34,44,45]. This is because Auger decays are beaten not only by M-shell photoabsorptions, but also by Nand O-shell photoabsorptions.…”
Section: A Pulse-duration Dependence Of Ionization Dynamicssupporting
confidence: 83%
“…1. In the low-fluence case (a), it is noticeable that the number of Auger decays decreases as the pulse duration becomes shorter, which is consistent with the observation in [34,44,45]. This is because Auger decays are beaten not only by M-shell photoabsorptions, but also by Nand O-shell photoabsorptions.…”
Section: A Pulse-duration Dependence Of Ionization Dynamicssupporting
confidence: 83%
“…This dramatic enhancement of ionization can be explained by charge-rearrangement-enhanced x-ray ionization of molecules (CREXIM) [17]. Hard x-ray photons are absorbed almost exclusively by the iodine atom, because its cross section is much larger than that of the light atoms (σ I =0.052 Mb, σ C =7.5×10 −5 Mb, The CREXIM effect manifests itself not only in the produced charges, but also in electron and fluorescence spectra [34]. In our calculations, charge rearrangement is described via instantaneous orbital relaxation upon sequential ionization and molecular Auger decay [21].…”
mentioning
confidence: 99%
“…Their unique properties have been used to study a diverse range of phenomena [7][8][9][10][11][12][13][14]. For many XFEL experiments a detailed, microscopic understanding of the radiation damage during the pulse exposure is crucial, e.g., to estimate the structural degradation in diffractive imaging experiments [8,15] or to interpret time-dependent spectroscopic signals [16,17]. However, the strong ionization by the x-ray pulses poses strong challenges for theoretical modeling.…”
Section: Introductionmentioning
confidence: 99%
“…To understand the interaction of intense x-ray light with matter, one must consider that a molecule interacting with the x-ray pulse may undergo a series of photoionization, fluorescence, and Auger decay processes eventually causing the ionization of a significant fraction of the electrons. It has been demonstrated that these ionization dynamics can be modeled via rate equations for the time-dependent populations of electronic configurations assuming multiple consecutive photoionization and electronic relaxation (Auger decay and fluorescence) steps [16,[18][19][20][21][22][23][24][25][26][27][28][29][30][31][32]. To that end the relevant cross sections and rates have to be provided.…”
Section: Introductionmentioning
confidence: 99%
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