2013
DOI: 10.1109/temc.2013.2261736
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Electromagnetic Radiation Resulting From PCB/High-Density Connector Interfaces

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Cited by 26 publications
(18 citation statements)
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“…Several studies have contributed to the understanding and quantifying of electromagnetic interference due to PCB connectors. Some recent work was performed in [1] to analyze the radiation from a simplified PCB/connector structure based on network parameters. Reference [2] presented different skew compensation techniques for the same simplified PCB/connector structure to mitigate transmission line common-mode conversion.…”
Section: Introductionmentioning
confidence: 99%
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“…Several studies have contributed to the understanding and quantifying of electromagnetic interference due to PCB connectors. Some recent work was performed in [1] to analyze the radiation from a simplified PCB/connector structure based on network parameters. Reference [2] presented different skew compensation techniques for the same simplified PCB/connector structure to mitigate transmission line common-mode conversion.…”
Section: Introductionmentioning
confidence: 99%
“…In [1]- [2], the radiation physics were studied for a simplified PCB/connector structure which did not contain conductor or dielectric loss. Although the radiation physics for the simplified PCB/connector structure may be similar to the practical model from which it is based, research is needed to study the radiation physics for the practical, commercial model.…”
Section: Introductionmentioning
confidence: 99%
“…Among these works, radiation from the connector itself is not considered. In [5], radiation was predicted from S-parameters using the law of power conservation from a board with connector above 1 GHz. In [5], the investigated connector contained a single wafer including only two differential pairs.…”
Section: Introductionmentioning
confidence: 99%
“…In [5], radiation was predicted from S-parameters using the law of power conservation from a board with connector above 1 GHz. In [5], the investigated connector contained a single wafer including only two differential pairs. However, a full connector includes tens of wafers (typically 20 to 50+ wafers) with numerous differential pairs per wafer.…”
Section: Introductionmentioning
confidence: 99%
“…It has been shown in [2] that S-parameters [3] of connector are related to its radiation. In this paper a novel test jig is designed to measure S-parameters of two columns of ICM ports simultaneously.…”
Section: Introductionmentioning
confidence: 99%