2019
DOI: 10.1088/1748-0221/14/09/c09031
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Electromagnetic inverse profiling for plasma diagnostics in compact microwave-based ion sources

Abstract: In this paper the problem of plasma diagnostics is faced as the solution of a onedimensional single-view multi-frequency electromagnetic inverse scattering technique. The aim of the problem is to provide effective means for plasma diagnostics by considering the dispersive properties of such medium. The inverse profiling, assessed against full-wave simulated data dealing with reliable benchmarks for microwave imaging, is carried out by exploiting a first order linearized method (Rytov approximation) and Compres… Show more

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“…Since the VESPRI setup is able for the moment to measure only the line-integrated plasma density, we are developing a dedicated microwave inverse profilometry (MIP) technique, based on inverse scattering, in order to retrieve the 1D-plasma density profile along the hornto-horn path; simulations are already available [15] and the measurements are expected in the near future.…”
Section: Experimentally Measured Diagnostics Performancesmentioning
confidence: 99%
“…Since the VESPRI setup is able for the moment to measure only the line-integrated plasma density, we are developing a dedicated microwave inverse profilometry (MIP) technique, based on inverse scattering, in order to retrieve the 1D-plasma density profile along the hornto-horn path; simulations are already available [15] and the measurements are expected in the near future.…”
Section: Experimentally Measured Diagnostics Performancesmentioning
confidence: 99%