2022
DOI: 10.1109/tap.2022.3177521
|View full text |Cite
|
Sign up to set email alerts
|

Electromagnetic Characterization of Thin Films by Using Non-Contacting Waveguides

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
0
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
3
1

Relationship

1
3

Authors

Journals

citations
Cited by 4 publications
(4 citation statements)
references
References 27 publications
0
0
0
Order By: Relevance
“…The reflection value is modulated by the sheet resistance value of the ground plane which varies as a function of applied stretching. The RF sheet resistance of PZ was analyzed in previous works [31], [32].…”
Section: Strain Sensor Designmentioning
confidence: 99%
See 3 more Smart Citations
“…The reflection value is modulated by the sheet resistance value of the ground plane which varies as a function of applied stretching. The RF sheet resistance of PZ was analyzed in previous works [31], [32].…”
Section: Strain Sensor Designmentioning
confidence: 99%
“…The overall matrix of the studied system is the product of the ABCD matrix of single building blocks. Once derived the complete ABCD matrix of the system, it is possible to derive both the reflection coefficient of the circuit model [32].…”
Section: Fssmentioning
confidence: 99%
See 2 more Smart Citations