Abstract:We perform electroluminescence (EL) intensity analysis on large-area monolithically-integrated Cu(In,Ga)Se2 (CIGS) modules. EL was measured in two modes: a fixed voltage near V MP, and a fixed current injection near IMP' The EL intensity was integrated across the image to give quantitative values ELv and EL" respectively. Differences in ELv between different modules reflect differences in average neutral bulk electronic properties (parameterized by carrier diffusion length Lo), while ELI is related to both neu… Show more
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