2010
DOI: 10.1557/mrs2010.505
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Electrodeposited magnetic layers in the ultrathin limit

Abstract: Magnetism is highly sensitive to the local atomic environment, a property that is at the origin of the unique magnetic behavior induced by the large ratio of surface or interface atoms to bulk atoms in nanostructures and ultrathin fi lms. One key property of strong relevance in technology is interface-induced perpendicular magnetization anisotropy, which often is observed in ultrathin magnetic layers of only a few atomic planes. Establishing the existence of this phenomenon required an improved control of the … Show more

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Cited by 24 publications
(25 citation statements)
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“…A close-up view of this 15-layer-thick Co film reveals narrow terraces with poorly-defined perimeters. This change in growth mode could result in variation in the magnetic property of Co thin film, as reported with Co deposited on Au (1 1 1), which exhibits a spin reorientation transition [6,21].…”
Section: In Situ Stm Imaging Of Cobalt Depositionmentioning
confidence: 71%
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“…A close-up view of this 15-layer-thick Co film reveals narrow terraces with poorly-defined perimeters. This change in growth mode could result in variation in the magnetic property of Co thin film, as reported with Co deposited on Au (1 1 1), which exhibits a spin reorientation transition [6,21].…”
Section: In Situ Stm Imaging Of Cobalt Depositionmentioning
confidence: 71%
“…From the perspective of electrodeposition, anions in the supporting electrolyte can influence greatly the growth mode and the roughness of Co deposit, yielding unlike critical thickness for spin orientation transition and anisotropic constant, as reported with the Co/Au(1 1 1) system [6,47]. This anion effect can be important also for Co deposition on Pt(1 1 1) and will be studied.…”
Section: Atomic Structures Of the Co Deposit On Ptmentioning
confidence: 90%
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“…ED requires η > 0 and is therefore also referred to as overpotential deposition (OPD). As the reaction is thermally activated, the deposition flux is given by an Arrhenius expression, F ∝ (e αzqη/kBT − 1), where q is the elementary charge and k B is the Boltzmann constant [54][55][56]. The transfer coefficient α ≈ 0.5 is related to the profile of the potential barrier across the electrolyte/substrate interface.…”
Section: Electrochemical Depositionmentioning
confidence: 99%
“…The nature of the anions may greatly influence whether and how UPD takes place [58]. Note that atomic details of ED can be observed in situ by means of electrochemical STM for both ED modes [54][55][56][57][58][59][60][61][62]. For semiconductor and oxide ED, the reader can refer to Refs [63][64][65].…”
Section: Electrochemical Depositionmentioning
confidence: 99%