2015
DOI: 10.1016/j.mssp.2015.07.003
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Electrodeposited and characterization of Ag–Sn–S semiconductor thin films

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Cited by 18 publications
(7 citation statements)
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“…𝑑𝑥 is the Fermi integral and 𝜁 is a dimensionless coefficient (reduced Fermi energy) related to the chemical potential by 𝜁 = 𝜇/𝐾 B 𝑇 , which is taken as the Fermi energy at room temperature 𝜇 = 0.75 eV for the Ag 8 SnS 6 semiconductor. [38] This gives 𝑆 = −168.1 µVK −1 , which is near the experimental value with an error factor in the order of 13%, possibly due to the experimental measurement. In fact, the increase of the temperature difference for 50 K will increase the Seebeck coefficient.…”
mentioning
confidence: 55%
“…𝑑𝑥 is the Fermi integral and 𝜁 is a dimensionless coefficient (reduced Fermi energy) related to the chemical potential by 𝜁 = 𝜇/𝐾 B 𝑇 , which is taken as the Fermi energy at room temperature 𝜇 = 0.75 eV for the Ag 8 SnS 6 semiconductor. [38] This gives 𝑆 = −168.1 µVK −1 , which is near the experimental value with an error factor in the order of 13%, possibly due to the experimental measurement. In fact, the increase of the temperature difference for 50 K will increase the Seebeck coefficient.…”
mentioning
confidence: 55%
“…It proves a narrow band gap of ATS. According to the different synthesis methods and nanoparticle sizes, the band gap of ATS ranges from 1.12 to 1.56 eV in different researches [32,37]. The optical band gap can be calculated by [38]: (αhυ)=A(hυ-E g ) n , where α is absorption coefficient, A is a constant and n is 0.5 or 2 for samples with a direct or indirect band gaps, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…Therefore, to obtain a flat ATS thin film, sulfurization needs to be performed at an annealing temperature of 550 °C or higher and with an annealing time of 60 min or longer. Compared with the SEM images of ATS thin films obtained by the sputtering, spin-coating, and electrodeposition methods, the grain size was large, no voids existed, and a flat surface was obtained, thus indicating that highquality thin films, expected to be absorbing layers in solar cells, were obtained [17,22,25,26]. Figure 3 shows the EDS surface elemental mapping images of samples 1-6 prepared by sulfide annealing at different temperatures and times.…”
Section: Effect Of Annealing Temperature and Time On Thin Filmsmentioning
confidence: 99%
“…CTS has a direct band-gap energy and a high absorption coefficient in the order of 10 4 cm –1 [ 9 , 10 , 11 , 12 , 13 ]. However, the highest reported conversion efficiency of these cells is as low as 5.24% [ 14 ], possibly owing to the CTS band gap of 0.92–0.95 eV [ 15 , 16 , 17 ], which is far from the ideal band gap of 1.4 eV for the light-absorbing layer. Reportedly, a (Cu, Ag) 2 SnS 3 thin film, in which Ag (a homologous element of Cu) is added to the CTS, is expected to improve the open-circuit voltage (V OC ) and fill factor (FF) [ 18 , 19 ].…”
Section: Introductionmentioning
confidence: 99%
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