Electrochromic TiO2, ZrO2 and TiO2–ZrO2 thin films by dip-coating method

Ivanova, T.; Harizanova, A.; Koutzarova, T.; Krins, Natacha; Vertruyen, Bénédicte

doi:10.1016/j.mseb.2009.07.013

Cited by 46 publications

(18 citation statements)

References 18 publications

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“…Changes in their properties caused by doping usually depend on the synthesis method and conditions, the ratios of the components, nature of source materials and post-synthesis treatments. ZrO 2 -TiO 2 oxide mixtures and Ti x-1 Zr x O 2 solid solutions have been prepared by various methods including hydrothermal [10], ultrasonic spray pyrolysis [6], sol-gel [1,5,7,11], co-precipitation [8] citric acid complexing method [9], screen printing [13,14], RF magnetron sputtering [15], mechanical ball milling [16] and dip coating [17].…”

Section: Introductionmentioning

confidence: 99%

Zirconium doped TiO2 thin films deposited by chemical spray pyrolysis

Juma

Açik

Oluwabi

et al. 2016

Applied Surface Science

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Section: Introductionmentioning

confidence: 99%

Zirconium doped TiO2 thin films deposited by chemical spray pyrolysis

Juma

Açik

Oluwabi

et al. 2016

Applied Surface Science

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“…Recently, we studied sol-gel TiO 2 films doped with vanadium, manganese oxide and zirconium oxide in respect to its structural and optical properties [21,22]. The films were deposited by dip-coating method on Si and glass substrates.…”

Section: Introductionmentioning

confidence: 99%

Preparation and characterization of ZnO–TiO2 films obtained by sol-gel method

Ivanova

Harizanova

Koutzarova

et al. 2011

Journal of Non-Crystalline Solids

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The sol-gel route has been applied to obtain ZnO-TiO 2 thin films. For comparison, pure TiO 2 and ZnO films are also prepared from the corresponding solutions. The films are deposited by a spin-coated method on silicon and glass substrates. Their structural and vibrational properties have been studied as a function of the annealing temperatures (400-750 °C). Pure ZnO films crystallize in a wurtzite modification at a relatively low temperature of 400 °C, whereas the mixed oxide films show predominantly amorphous structure at this temperature. XRD analysis shows that by increasing the annealing temperatures, the sol-gel Zn/Ti oxide films reveal a certain degree of crystallization and their structures are found to be mixtures of wurtzite ZnO, Zn 2 TiO 4 , anatase TiO 2 and amorphous fraction. The XRD analysis presumes that Zn 2 TiO 4 becomes a favored phase at the highest annealing temperature of 750 °C. The obtained thin films are uniform with no visual defects. The optical properties of ZnO-TiO 2 films have been compared with those of single component films (ZnO and TiO 2 ). The mixed oxide films present a high transparency with a slight decrease by increasing the annealing temperature.

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“…1(f), peaks corresponding to two major structures, cubic (c)-ZrO 2 (JCPDS card No. 89-9069) and tetragonal (t)-ZrO 2 [30] (JCPDS card No. 89-6976), appear for the samples annealed at high temperatures.…”

Section: Surface Characterisationmentioning

confidence: 99%