In this study, radio-frequency
sputtered tantalum vanadium oxide
(TaVO
x
) films are investigated as a promising
material for the ion storage layer in an electrochromic device. Using
spectroelectrochemical measurements by cyclic voltammetry, the electrochromic
switching properties of the material are presented. The intercalation
and deintercalation mechanisms of Li+ ions into TaVO
x
thin films have been studied by X-ray photoelectron
spectroscopy. To obtain information about the composition and electronic
structure of the material, films with different degrees of intercalation
levels of Li+ ions are studied. The results clarify which
species are involved in the electrochromic mechanism. In order to
be able to evaluate the stability of electrochemically treated samples,
films in the final deintercalated state are also analyzed. It is shown
that only vanadium is actively involved in the investigated redox
reaction. Finally, TaVO
x
is integrated
with the solid-state electrolyte lithium phosphorus sulfuric oxynitride
into a model electrochromic switching cell. Chronoamperometry shows
a stable charge transfer of about 27 mC cm–2 combined
with suitable values for optical transmittance of more than 70% (at
550 nm). Based on the high stability in terms of charge density and
suitable color neutrality, we confirm the general suitability of this
material combination for use in electrochromic applications.