2020 International Wafer Level Packaging Conference (IWLPC) 2020
DOI: 10.23919/iwlpc52010.2020.9375876
|View full text |Cite
|
Sign up to set email alerts
|

Electrochemical Plating of Nano-Twinned Cu for WLP Applications

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
0
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 9 publications
0
0
0
Order By: Relevance
“…We formulated Gen1 nt-Cu with a single additive in an acidic makeup solution with expansive operating windows, including concentration, agitation, and current density [16,17]. Fig.…”
Section: A Gen 1 Nanotwinned Cumentioning
confidence: 99%
“…We formulated Gen1 nt-Cu with a single additive in an acidic makeup solution with expansive operating windows, including concentration, agitation, and current density [16,17]. Fig.…”
Section: A Gen 1 Nanotwinned Cumentioning
confidence: 99%
“…We formulated Gen1 nt-Cu with a single additive in an acidic makeup solution with expansive operating windows, including concentration, agitation, and current density [11,12]. Fig.…”
Section: A Gen 1 Nanotwinned Cumentioning
confidence: 99%