2016 39th International Spring Seminar on Electronics Technology (ISSE) 2016
DOI: 10.1109/isse.2016.7563195
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Electrochemical migration of Cu and Sn in Na2SO4 environment

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Cited by 4 publications
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“…Only a precipitate is formed. However, when the concentration is increased beyond a certain point, dendritic growth occurs again with increasing risk of a short circuit [14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…Only a precipitate is formed. However, when the concentration is increased beyond a certain point, dendritic growth occurs again with increasing risk of a short circuit [14][15][16][17][18].…”
Section: Introductionmentioning
confidence: 99%
“…A considerable number of studies have investigated the suppression of ECM, with the aim of preventing electronic device failure (Minzari et al, 2011 andZhong et al, 2013), and these studies have reported that the precipitation grows as dendrites (Krumbein, 1988, Liu et al, 2011and Medgyes et al, 2016. Attempts have also been made to exploit precipitation because ECM is a low-cost and green fabrication technique in which the reaction is caused simply by DC voltage and water without any metal salts or hydroxides (Nakajima et al, 2015).…”
Section: Introductionmentioning
confidence: 99%