2015
DOI: 10.1134/s1063739715070069
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Electrically programmable nonvolatile memory in CMOS technology

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Cited by 4 publications
(2 citation statements)
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“…This state is defined as the "0" state. The process of pulling electrons from the floating gate to the drain is defined as writing or programming [13].…”
Section: Eeprom Cell Typesmentioning
confidence: 99%
“…This state is defined as the "0" state. The process of pulling electrons from the floating gate to the drain is defined as writing or programming [13].…”
Section: Eeprom Cell Typesmentioning
confidence: 99%
“…Such memory devices are fundamentally non-volatile, meaning that they retain stored information even in the absence of power [ 1 ]. Compared to traditional silicon-based memory devices such as volatile static random-access memory (SRAM) [ 2 ], dynamic random-access memory (DRAM) [ 3 ], or non-volatile Flash memory [ 4 ] and electrically erasable programmable read-only memory (EEPROM) [ 5 ], ferroelectric memory devices exhibit superior performance in terms of faster read and write speeds, higher endurance, and more prolonged data retention capabilities [ 6 , 7 , 8 , 9 ]. Ferroelectric materials form the core of ferroelectric memory devices and have been intensively researched.…”
Section: Introductionmentioning
confidence: 99%