2015
DOI: 10.1155/2015/654840
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Electrical Switching in Thin Film Structures Based on Transition Metal Oxides

Abstract: Electrical switching, manifesting itself in the nonlinear current-voltage characteristics with S- and N-type NDR (negative differential resistance), is inherent in a variety of materials, in particular, transition metal oxides. Although this phenomenon has been known for a long time, recent suggestions to use oxide-based switching elements as neuristor synapses and relaxation-oscillation circuit components have resumed the interest in this area. In the present review, we describe the experimental facts and the… Show more

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Cited by 26 publications
(26 citation statements)
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“…The switching effect has been observed in vanadium dioxide single crystals and thin-film structures of both planar and sandwich-type [1,5,7], as well as in vanadate-phosphate glasses [26], VO 2 -containing ceramics [27], and V 2 O 5 -gel films [8,28]. When as-prepared samples do not consist of pure vanadium dioxide, preliminary electrical forming (EF) is required, resulting in formation of the VO 2 -containing channel [7,8,[26][27][28].…”
Section: Switching In Mom Structuresmentioning
confidence: 99%
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“…The switching effect has been observed in vanadium dioxide single crystals and thin-film structures of both planar and sandwich-type [1,5,7], as well as in vanadate-phosphate glasses [26], VO 2 -containing ceramics [27], and V 2 O 5 -gel films [8,28]. When as-prepared samples do not consist of pure vanadium dioxide, preliminary electrical forming (EF) is required, resulting in formation of the VO 2 -containing channel [7,8,[26][27][28].…”
Section: Switching In Mom Structuresmentioning
confidence: 99%
“…In addition, in MOM structures with vanadium dioxide, as well as in structures based on some other transition metal oxides, the phenomenon of electrical switching associated with MIT is observed [7]. The switching effect is a sharp, significant, and reversible change in the system conductivity under the action of the applied electric field.…”
Section: Introductionmentioning
confidence: 99%
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