Abstract:Unusually complex spectra have been obtained for InAs/GaAs quantum dot (QD) structures when studied as a function of applied bias by deep level transient spectroscopy (DLTS). In spite of their complexity, basic processes for electron escape from the QDs have been recognized. We show that due to the variety of transitions involving direct tunneling and more complex thermal transitions, due to QD size fluctuations, and environmental dependent QD carrier population, measurement conditions have to be carefully sui… Show more
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