2012
DOI: 10.1364/oe.20.028808
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Electrical pump & probe and injected carrier losses quantification in Er doped Si slot waveguides

Abstract: Electrically driven Er3+ doped Si slot waveguides emitting at 1530 nm are demonstrated. Two different Er 3+ doped active layers were fabricated in the slot region: a pure SiO 2 and a Si-rich oxide. Pulsed polarization driving of the waveguides was used to characterize the time response of the electroluminescence (EL) and of the signal probe transmission in 1 mm long waveguides. Injected carrier absorption losses modulate the EL signal and, since the carrier lifetime is much smaller than that of Er 3+ ions, a s… Show more

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Cited by 4 publications
(2 citation statements)
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References 29 publications
(33 reference statements)
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“…On the other side, the inclusion of rare earth ions as luminescent centers, and Er 3+ ions in particular, has demonstrated to be promising for the development of CMOS compatible light emitting sources at 1.5 µm . Near infrared light emitting devices have been previously reported using Er implanted PN junctions , metal‐oxide‐semiconductor devices or even slot waveguide geometries .…”
Section: Introductionmentioning
confidence: 99%
“…On the other side, the inclusion of rare earth ions as luminescent centers, and Er 3+ ions in particular, has demonstrated to be promising for the development of CMOS compatible light emitting sources at 1.5 µm . Near infrared light emitting devices have been previously reported using Er implanted PN junctions , metal‐oxide‐semiconductor devices or even slot waveguide geometries .…”
Section: Introductionmentioning
confidence: 99%
“…37. Simulaciones 2D-FDTD con resolución 30nm de un DBR con Λ=229nm, = 0.53, ℎ ℎ = 70nm y N = 20 para la obtención de (a) la reflectividad y (b) transmitancia en función de la variación del espesor de las capas de óxido y .…”
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