2018
DOI: 10.7567/jjap.57.071101
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Electrical properties of ZnO:H films fabricated by RF sputtering deposition and fabrication of p-NiO/n-ZnO heterojunction devices

Abstract: A high-transparency ZnO thin film of high carrier concentration was grown by conventional RF sputtering, where the carrier concentration was continuously varied from 10 16 to 10 19 cm %3 by controlling the amounts of O 2 and H 2 sputtering gases. To prevent the formation of a Schottky junction at the contact with In-Zn-O, and to improve the fill factor of a visible-light-transparent solar cell, a Ag-paste/NiO/ZnO/ZnO:H/IZO p-n diode structure with the carrier concentration of the ZnO:H layer of 10 19 cm %3 was… Show more

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Cited by 13 publications
(21 citation statements)
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“…It is noted that the V OC and J SC of only the NiO/ ZnO solar cell without the sensor and insulating layers were 0.49 V and 57 μA cm À2 , respectively. [25] The V OC and J SC of the integrated self-powered device were lower than those of only the solar cell layer. As the CO 2 sensor layer and insulating layer were deposited on the solar cell layer, the amount of UV light absorbed by the solar cell layer decreased.…”
Section: Resultsmentioning
confidence: 95%
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“…It is noted that the V OC and J SC of only the NiO/ ZnO solar cell without the sensor and insulating layers were 0.49 V and 57 μA cm À2 , respectively. [25] The V OC and J SC of the integrated self-powered device were lower than those of only the solar cell layer. As the CO 2 sensor layer and insulating layer were deposited on the solar cell layer, the amount of UV light absorbed by the solar cell layer decreased.…”
Section: Resultsmentioning
confidence: 95%
“…The open‐circuit voltage ( V OC ) was 0.16 V, and the short‐circuit current density ( J SC ) was 1.04 nA cm −2 . It is noted that the V OC and J SC of only the NiO/ZnO solar cell without the sensor and insulating layers were 0.49 V and 57 μA cm −2 , respectively . The V OC and J SC of the integrated self‐powered device were lower than those of only the solar cell layer.…”
Section: Resultsmentioning
confidence: 96%
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