2012 IEEE Symposium on Industrial Electronics and Applications 2012
DOI: 10.1109/isiea.2012.6496678
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Electrical properties of neutron-irradiated silicon and GaAs commercial diodes

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Cited by 6 publications
(7 citation statements)
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“…The value of R s is comparable with other measurements found in literature, although there is a wide spread of reported values (e.g. [19]). We were not able to find a reliable value of G for the 1N4148 diode in the literature.…”
Section: Resultssupporting
confidence: 90%
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“…The value of R s is comparable with other measurements found in literature, although there is a wide spread of reported values (e.g. [19]). We were not able to find a reliable value of G for the 1N4148 diode in the literature.…”
Section: Resultssupporting
confidence: 90%
“…The two parameters are strongly correlated so that an overestimation of the exponential characteristic constant involves an underestimation of the factor A and the E G value is 80 meV lower than the one expected and with the disposable literature data [23][24][25]. This could be explained in terms of a high doping level at 2 to 3× -10 cm 19 3 .…”
Section: S Be Gmentioning
confidence: 61%
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“…An increase in these defects implies an increase in the density of the recombination centres; this reduces the minority carrier lifetime [36,46]—time taken by a minority carrier to recombine. Consequently, there is a decrease of the current gain [16] because there was an increase in the leakage current; resulting from an increase in the density of the generation-recombination centres [48]. In other words, the creation of more recombination centres in the form of isolated and clustered defects [47] could be assumed to be diluting the charge concentration.…”
Section: Phototransistorsmentioning
confidence: 99%
“…A possible solution to output degradation would be annealing the LEDs to "flush out" the vacancies and interstitials. During the annealing process, both the vacancies Bombardments during Compton scattering and photoelectric effects could displace charge (electrons) from their original lattice structural locations [26,54]. This results in the absence of electrons in their normal lattice positions (vacancies) and electrons occupying lattice positions where they are not meant to be (interstitials) [54].…”
Section: Degradation Of C-v Responsementioning
confidence: 99%