Proceedings of the 2004 IEEE International Conference on Solid Dielectrics, 2004. ICSD 2004.
DOI: 10.1109/icsd.2004.1350391
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Electrical properties of metallocene polyethylene

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Cited by 13 publications
(3 citation statements)
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“…It reected the probability of a material being broken down at a certain electric eld strength E or the probability of failure at a certain time t. The Weibull distribution was widely used to evaluate the statistical law of the breakdown behavior of insulating materials under alternating electric elds. [24][25][26] The expression of the twoparameter Weibull distribution was showed as follow:…”
Section: Breakdown Voltage Of Nanocomposites Under Different Lling Amentioning
confidence: 99%
“…It reected the probability of a material being broken down at a certain electric eld strength E or the probability of failure at a certain time t. The Weibull distribution was widely used to evaluate the statistical law of the breakdown behavior of insulating materials under alternating electric elds. [24][25][26] The expression of the twoparameter Weibull distribution was showed as follow:…”
Section: Breakdown Voltage Of Nanocomposites Under Different Lling Amentioning
confidence: 99%
“…The Weibull distribution, proposed by the Swedish physicist Weibull in 1939, has been widely used to represent breakdown voltages. [18][19][20] It reected the failure probability of a dielectric being broken down at a certain electric eld strength E. In this test, the two-parameter Weibull distribution was applied to evaluate the statistical law of the breakdown behavior of HTV SR under alternating electric elds. The function can be expressed as: 15…”
Section: Ac Breakdown Studiesmentioning
confidence: 99%
“…The breakdown test was carried out at a temperature of 30°C.The samples used in DC breakdown test are about 0.1mm in thick, and the film surfaces are plated aluminum foil electrodes in Φ25mm diameter. Weibull statistical distribution was used to evaluate breakdown behavior of material [4][5][6][7][8] and the Weibull statistical distribution in the case of step or ramp voltage test can be written as 0 ( ) 1 exp( )…”
Section: Electron Microscopy Scanning Use the Dutch Philips Field Emi...mentioning
confidence: 99%