2011 Proceedings of IEEE Southeastcon 2011
DOI: 10.1109/secon.2011.5752901
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Electrical properties of conductive metal/insulating shell nanocluster array

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Cited by 2 publications
(3 citation statements)
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“…Their dimensions were confirmed by feature size measurements using a Raith 150 scanning-electron-microscope (SEM) in imaging mode [17], an image of which is shown in Fig. 1(a).…”
Section: Experimental Workmentioning
confidence: 91%
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“…Their dimensions were confirmed by feature size measurements using a Raith 150 scanning-electron-microscope (SEM) in imaging mode [17], an image of which is shown in Fig. 1(a).…”
Section: Experimental Workmentioning
confidence: 91%
“…The sample was carefully positioned in between the electrodes as described by Moorthy et al [17]. This setup was placed in a closed furnace for electrical measurements.…”
Section: (A) and 2(b)mentioning
confidence: 99%
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