2015
DOI: 10.1007/s40094-015-0191-7
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Electrical properties and I–V characteristics of 5,14-dihydro-5,7,12,14-tetraazapentacene doped Schottky barrier diode

Abstract: The current-voltage (I-V) characteristics of Aluminium/5,14-dihydro-5,7,12,14-tetraazapentacenes (L5H2 or DHTAPs) doped surface-type structures were investigated in air at ambient temperature and moisture. The conventional forward bias I-V method, Semi-logarithm, Cheung functions and modified Norde's function were used to extract the diode parameters including ideality factor, series resistance and barrier height. The parameter values obtained from these four different methods were found in good agreement.

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Cited by 17 publications
(4 citation statements)
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“…The device shows a reasonable rectification factor of 3. Although such rectification ratio is lower than that of typical inorganic heterojunction diodes (e.g., SnO 2 /PEDOT:PSS/ PVP and PANI:PEDOT:PSS blends) 16,17 , yet it is still higher than that of organic/inorganic heterojunction diodes (e.g., PEDOT:PSS-PVA/n-Si, and Al/5,14-dihydro-5,7,12,14-tetraazapentacenes (DHTAPs)) 18,19 . For improvement of the rectification ratio, one can consider: (1) improving the diode ideality factor via reducing the nonhomogeneity in the PEDOT:PSS film thickness and the irregularities of the barrier height by optimizing the thin film deposition technique; (2) enhancing the carriers injection efficiency via e.g., diminish the energetic difference…”
mentioning
confidence: 85%
“…The device shows a reasonable rectification factor of 3. Although such rectification ratio is lower than that of typical inorganic heterojunction diodes (e.g., SnO 2 /PEDOT:PSS/ PVP and PANI:PEDOT:PSS blends) 16,17 , yet it is still higher than that of organic/inorganic heterojunction diodes (e.g., PEDOT:PSS-PVA/n-Si, and Al/5,14-dihydro-5,7,12,14-tetraazapentacenes (DHTAPs)) 18,19 . For improvement of the rectification ratio, one can consider: (1) improving the diode ideality factor via reducing the nonhomogeneity in the PEDOT:PSS film thickness and the irregularities of the barrier height by optimizing the thin film deposition technique; (2) enhancing the carriers injection efficiency via e.g., diminish the energetic difference…”
mentioning
confidence: 85%
“…Its structural and electrochemical properties have already been reported, , and its electronic band structure has been revealed by ultraviolet photoemission spectroscopy . Driven by new efficient synthesis routes, its fundamental properties and its potential for organic devices have been assessed. ,,, However, extended DHTA n for n > 5 have not been reported so far where the presence of extra phenyl rings should affect the stability of their oxidized and/or reduced forms. Also, a systematic study on the electronic structure of the whole DHTA n family of molecules using a state-of-the-art and predictive ab initio electronic structure method is still lacking.…”
Section: Introductionmentioning
confidence: 99%
“…From Figure 6, it is possible to infer the ideality factor, the barrier height and the series resistance (Rs) of the investigated devices. For this aim, it is necessary to use the slope and y-intercept of the dV/dln(I) for determining the ideality factor and series resistance values, while considering the y-axis intercept and slope of H(I) plots makes it possible to obtain barrier height and series resistance of the device [51]. From Equation ( 6), the Rs values were calculated as 221 Ω and 188 Ω for dark and illumination conditions.…”
Section: Au/n-si and Au/pinus Brutia/n-si Devices Performacesmentioning
confidence: 99%
“…In addition, from the C-V curves the barrier height value of the Au/Pinus brutia/n-Si device was determined as 0.93 eV, which is considerably higher if compared with the one obtained from I-V measurements. This result can be explained by the non-homogeneous nature of the barrier height formed due to the presence of the interface oxide layer on the n-Si wafer and the non-uniformity of the interface layer [51]. The carrier density of the fabricated device was calculated from the C-V curves.…”
Section: Au/n-si and Au/pinus Brutia/n-si Devices Performacesmentioning
confidence: 99%