Electrical Contact Resistance of Contact Bodies With Cambered Surface

Ren, Wanbin; Zhang, Chao; Sun, Xilai

doi:10.1109/access.2020.2994085

Cited by 21 publications

(15 citation statements)

References 45 publications

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“…Concerning the data presented in [ 18 ], it can be noted that the experimental results were between the two analytical calculations (Holm and Greenwood). Additionally, from the point of view of the relationship between contact resistance and the area of contact, similar variation results were reported by Shujuan et al [ 13 ], Ren et al [ 14 ], Lim et al [ 15 ], and Su et al [ 24 ].…”

Section: Discussionsupporting

confidence: 85%

“…Numerous studies on contact resistance and electrical contacts have made mention of Greenwood’s and Holm’s analytical model for contact resistance calculation [ 6 , 7 , 8 , 9 , 10 , 11 , 12 , 13 , 14 , 15 , 16 , 17 , 18 ]. The research reported in this paper used Holm’s and Greenwood’s models to calculate the contact resistance.…”

Section: Analytical Models For Contact Resistancementioning

confidence: 99%

“…Shujuan et al [ 13 ] built a contact resistance model based on a rough surface contact model by surface profile measurement and statistical analysis. Ren et al [ 14 ] and Lim et al [ 15 ] both analyzed contact resistance by applying a combination of experimental, numerical, and analytical methods. Malucci [ 16 , 17 ] established several models, considering the influence of interface films to predict the performance of degraded contacts.…”

Section: Introductionmentioning

confidence: 99%

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Computation of the Electrical Resistance of a Low Current Multi-Spot Contact

Dankat

Dumitran

2022

Materials

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In high complexity electrical systems such as those used in the automotive industries, electric connectors play an important role. The automotive industry is gradually shifting its attention to electric cars, which means more electrical connectors for sensors and data collection. A fault in connectors for sensors used in a vehicle can cause drastic damage to capital equipment and, in the worst case, the loss of life. The studies of faults or degradation of electrical contacts are essential for safety in vehicles and various industries. Although such faults can be due to numerous factors (such as dust, humidity, mechanical vibration, etc.) and some yet to be discovered, high contact resistance is the main factor causing erratic behavior of electrical contacts. This paper presents a study on the computation of electrical contact resistance of two metal conductors (in the form of a disk) with analytical relations and a numerical computation model based on the finite element method (FEM) in COMSOL Multiphysics. The contact spots were considered to have a higher electrical resistivity value (ρcs) than those of the two metal conductors (ρCu). Studies such as the one in view that is carried out on a microscopic level are often difficult to investigate experimentally. Therefore, with the help of a simplified numerical model, the consequences of the degradation of electrical contacts are investigated. To validate the FEM model, the numerical results were compared to those obtained from analytical models.

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Section: Discussionsupporting

confidence: 85%

Section: Analytical Models For Contact Resistancementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Computation of the Electrical Resistance of a Low Current Multi-Spot Contact

Dankat

Dumitran

2022

Materials

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“…    As mentioned above, the corresponding ωc at the inception of the elastic-plastic deformation regime can be determined by using Equation (4). Additionally, the corresponding * p  at the end of elastic-plastic deformation regime can be determined by using Equation (14). Furthermore, to estimate the contact parameters of the elastic-plastic range, the empirical formula is proposed in this work as follows:…”

Section: Elastic-plastic Rangementioning

confidence: 99%

“…Contact between two rough surfaces can be equivalent to contact between a hemisphere and a rigid flat [11][12][13]. The study of elastic-plastic contact behavior between hemisphere and a rigid flat is of great significance to the analysis of electrical contact [14][15][16][17], friction [18,19], and wear [20,21] between two rough surfaces.…”

Section: Introductionmentioning

confidence: 99%

Research on Elastic–Plastic Contact Behavior of Hemisphere Flattened by a Rigid Flat

et al. 2022

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The contact behavior of a hemisphere pressed by a rigid plane is of great significance to the study of friction, wear, and conduction between two rough surfaces. A flattening contact behavior of an elastic–perfectly plastic hemisphere pressed by a rigid flat is researched by using the finite element method in this paper. This behavior, influenced by different elastic moduli, Poisson’s ratios, and yield strengths, is compared and analyzed in a large range of interference values, which have not been considered by previous models. The boundaries of purely elastic, elastic–plastic, and fully plastic deformation regions are given according to the interference, maximum mean contact pressure, Poisson’s ratio, and elastic modulus to yield strength ratio. Then, a new elastic–plastic constitutive model is proposed to predict the contact area and load in the elastic–plastic range. Compared with previous models and experiments, the rationality of the present model is verified. The study can be applied directly to the contact between a single sphere and a plane. In addition, the sphere contact can also be used to simulate the contact of single asperity on rough surfaces, so the present proposed model can be used to further study the contact characteristics of rough surfaces.

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Interface Evolution of Solid Oxide Cells between the Electrode and the Interconnect Rib Induced with Applied Current

et al. 2022

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Herein, the interface evolution of solid oxide cells (SOCs) on the interfacial contact resistance (ICR) between the electrode and the interconnect rib at different current densities is quantitatively studied using a stainless steel 430 (SUS430)/(La,Sr) (Co,Fe)O3 (LSCF)/SUS430 sandwich structure. To simulate the actual operation of SOCs, different current densities (200, 400, 600, 800, and 1000 mA cm−2) are applied to the sandwich structure by an external power supply and a DC electronic load. Experimental results show that, under an isothermal condition for 1012 h and a thermal cycling condition for 15 times, ICR is smaller when the current density is increased. This phenomenon may be due to the softening of the oxide film on the SUS430 interconnect rib and an increase in the contact area between the SUS430 interconnect rib and the electrode LSCF. Additionally, the microstructure, surface roughness, and contact theory are analyzed in detail. The results indicate that interface contact between the electrode and the interconnect rib may be improved with suitable applied current. This work provides the understanding of possible interface evolution of SOCs induced with applied current.

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Electrical Contact Resistance of Contact Bodies With Cambered Surface

Cited by 21 publications

References 45 publications

Computation of the Electrical Resistance of a Low Current Multi-Spot Contact

Computation of the Electrical Resistance of a Low Current Multi-Spot Contact

Research on Elastic–Plastic Contact Behavior of Hemisphere Flattened by a Rigid Flat

Interface Evolution of Solid Oxide Cells between the Electrode and the Interconnect Rib Induced with Applied Current

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