Electrical conductivity of free-standing mesoporous silicon thin films

Khardani, M.; Bouaïcha, M.; Dimassi, Wissem; Zribi, M.; Aouida, S.; Bessaı̈s, B.

doi:10.1016/j.tsf.2005.08.297

Cited by 14 publications

(10 citation statements)

References 9 publications

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“…Nanoporous and mesoporous silicon prepared from p and p + -type silicon, consists of randomly interconnected quantum dots (size dimension ≤ 4 nm), and an arrangement of quantum wires (4 -50 nm) respectively [4]. It is common practice to use the Bruggeman effective medium theory [5] to estimate the average ''effective'' optical and/or electrical parameters [6,7]. The first part of this work deals with a description of the technique and the choice of the experimental conditions that allow transmission spectra measurements and estimation of the refractive index and the dielectric constant of nano-and free-standing meso-PS using the Goodman's method [8] and the Bragg law, respectively.…”

Section: Introductionmentioning

confidence: 99%

Bruggeman effective medium approach for modelling optical properties of porous silicon: comparison with experiment

Khardani

Bouaïcha

Bessaı̈s

2007

Phys. Status Solidi (c)

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134

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While numerous works deal with the properties and applications of porous silicon (PS), some of the related topics are not complete or could be investigated from different aspects. The main objective of this paper is to provide novel information associated with the optical properties of nano-and meso-PS by studying the variation of the effective refractive index (n eff ) and the relative dielectric constant (ε r,eff ) as a function of porosity. For this purpose various PS samples were prepared by electrochemical etching of p and p + -type silicon wafers in order to form silicon supported nano-PS and free-standing meso-PS layers, respectively. The experimental effective optical parameters (n eff , ε r,eff ) of the meso-PS films, were determined from the transmission spectra and the Bragg law. While, in the case of nano-PS layers, we applied the Goodman method, and deduced the values of n eff and ε r,eff from the Bruggeman's effective medium approximation (EMA). In the EMA calculation, the PS structure was considered as being a physical combination of three distinct phases formed by silicon, silicon dioxide and voids with a convenient volume fraction. A good agreement between theory and experiment was found in the case of silicon-supported nano-PS for all porosities. However, for free-standing meso-PS, the theory does not well fit the experimental results for porosities lower than 50% and higher than 70%.

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Section: Introductionmentioning

confidence: 99%

Bruggeman effective medium approach for modelling optical properties of porous silicon: comparison with experiment

Khardani

Bouaïcha

Bessaı̈s

2007

Phys. Status Solidi (c)

Self Cite

134

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“…In this context, we assumed that PS is itself as a model of QWs. The modeling of PS as Si quantum wires (SiQWs) has been reviewed in [12,18,19]. We assumed that the electrical conductance of PS is provided by the contribution of the Si nanocrystallites.…”

Section: Conductance Of the Porous Silicon Nanocrystallitesmentioning

confidence: 99%

Electrical conductance and magnetoconductance effect on n-type porous silicon: Contribution of weak localization correction

Chouaibi

Radaoui

Fredj

et al. 2015

Superlattices and Microstructures

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“…74,75 Whatever the morphology, the electrical behavior is strongly modulated by the porosity. 76,77 Moreover, the electrical conductivity of moderate porosity layers is thermally activated with activation energies of about 0.5 eV. 78 For a complete review on I-V measurements, one can see Ref.…”

Section: B Ps Electrical Conductivitymentioning

confidence: 99%