1976
DOI: 10.1016/0040-6090(76)90389-8
|View full text |Cite
|
Sign up to set email alerts
|

Electrical conductivity in structurally inhomogeneous discontinuous metal films

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
9
0

Year Published

1980
1980
2022
2022

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 30 publications
(10 citation statements)
references
References 1 publication
1
9
0
Order By: Relevance
“…Varying the voltage across the film yields the diode-like characteristic shown in figure 36, where the approximate 10:1 resistance ratio very nearly matches that observed by Borziak et al (figure 22) [30,64].…”
Section: Diode Effectsupporting
confidence: 79%
See 2 more Smart Citations
“…Varying the voltage across the film yields the diode-like characteristic shown in figure 36, where the approximate 10:1 resistance ratio very nearly matches that observed by Borziak et al (figure 22) [30,64].…”
Section: Diode Effectsupporting
confidence: 79%
“…Their results generally show minimum electric fields in the bulk of the film, away from the contacts, with larger values towards the contacts. The assumption was that these effects were due to structural variations along the film but the deviations from linearity in figure 17(a) suggest the existence of space charges in the film [64]. The implication in the text is that the L and R contacts for figure 17(a) are identical and of type a in figure 18.…”
Section: Electric Field Distributionmentioning
confidence: 97%
See 1 more Smart Citation
“…Currentvoltage ͑IV͒ measurements were linear for both types of films without hysteresis or polarity-dependence for biases up to several volts which indicates homogenous electrode/film interfaces. 17 However, electric transport across a nanogap which is described by quantum tunneling, only presents linear IV behavior for small enough biases V approaching 0 V that do not alter the height of the energy barrier. 18 This discrepancy can be explained by the distribution of the external bias into small potential drops across the multitude of nanogaps within a discontinuous film.…”
mentioning
confidence: 99%
“…As a result the weak spots of the filament will rupture with an accelerating decrease of current, and this is the cause of catastrophic breakdown (in CD region) with showing VCNR region. In N-type switching, an increase in the bias voltage caused the current to reach a minimum value and then to increase again as shown in Figure 2 for 7.5 wt% V, Figure 3 for the thickness of 200 nm, respectively, as observed in planar discontinuous metal films [14]. The regions of BC, CD may be explained similarly but beyond this region as in Figure 2 may be explained by introducing the concept of trapping centers.…”
Section: Resultsmentioning
confidence: 83%