2005
DOI: 10.1143/jjap.44.l1563
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Electrical Characterization of Metal-Coated Carbon Nanotube Tips

Abstract: Electrical characteristics of bare and metal-coated carbon nanotube (CNT) tips were investigated with an independently driven four-tip scanning tunneling microscope (STM). The CNT was glued on a W tip apex and wholly coated ex situ by metal thin layers. The resistance between the CNT-tip end and the W supporting tip scattered very widely from ca. 50 k to infinity for the bare tips, while coating the tip with a 6-nm-thick PtIr film stably reduced the resistance to less than approximately 10 k. The W coating was… Show more

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Cited by 19 publications
(24 citation statements)
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“…The lattice fringe of the CNT was clearly observed, indicating that the crystallinity of the inner MWNT was maintained. From the elemental analysis by energy dispersive X-ray spectroscopy (EDX) in TEM, the atom ratio of Pt to Ir was estimated to be 74:26, which was similar to the composition of the target [14].…”
Section: Resultsmentioning
confidence: 88%
See 1 more Smart Citation
“…The lattice fringe of the CNT was clearly observed, indicating that the crystallinity of the inner MWNT was maintained. From the elemental analysis by energy dispersive X-ray spectroscopy (EDX) in TEM, the atom ratio of Pt to Ir was estimated to be 74:26, which was similar to the composition of the target [14].…”
Section: Resultsmentioning
confidence: 88%
“…Thereby, we performed more than 100 times I − V measurements, and derived the contact resistance at the CNT-tip junction of the PtIr-coated CNT tip. The contact resistance of the PtIr-coated CNT tip ranges from several kΩ to 10 kΩ, which is lower than that of W-coated CNT tip (∼ 50 kΩ) [14]. Since the PtIr is hardly oxidized in air and the W is easily oxidized, it is thought that the W thin layer was oxidized due to the exposure of CNT tips in air during the transfer from the PLD apparatus to the four-tip STM.…”
Section: Resultsmentioning
confidence: 97%
“…Without the metal coating, the resistance at the CNT-W junction scattered from 100 k to several M from tip to tip, which was too high for the probes in conductivity measurements. The details of the tip fabrication and its electrical and mechanical characterizations are discussed elsewhere [23,24].…”
Section: Methodsmentioning
confidence: 99%
“…In order to prepare ultimately sharp tips for multi-tip STM (coated) carbon nanotubes or nanowires have been attached to tungsten tips. [66][67][68] FIG. 9.…”
Section: Tips For Multi-tip Stmmentioning
confidence: 99%