2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) 2012
DOI: 10.1109/nano.2012.6322207
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Electrical characterization of 1D SnO<inf>2</inf> nanowires

Abstract: In this study, a method to identify the impedance of the sample composed of Sn02 nanowires (NWs) has been presented. The studied sensor structures were based on one dimensional (ID) Sn02 NWs grown by thermal deposition on silicon substrate. The topography of Sn02 NWs was investigated by means of scanning electron microscopy (SEM).The results of qualitative and quantitative analysis in selected micro region have been presented. Furthermore, the electrical properties of the NWs were measured. The base of the mea… Show more

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Cited by 1 publication
(2 citation statements)
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“…1) that was used to measure the impedance of the samples as a function of frequency and the calculation algorithm were presented in our previous work [19]. The main part of the measuring system is HP 85046A S-Parameter Test Set, which operates with HP 8753 Network Analyzer manufactured by Hewlett Packard.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…1) that was used to measure the impedance of the samples as a function of frequency and the calculation algorithm were presented in our previous work [19]. The main part of the measuring system is HP 85046A S-Parameter Test Set, which operates with HP 8753 Network Analyzer manufactured by Hewlett Packard.…”
Section: Methodsmentioning
confidence: 99%
“…Sample measurements were made using a probe based on N-type angle connector and 50 Ω coaxial cable. The frequency dependence of the impedance was approximated by a rational function with the constraints on circuit described by the function [19]. Transmittance spectroscopy study in the spectral range of 200 to 1000 nm was performed with the application of UV-Vis HR4000CG (Ocean Optics) spectrophotometer.…”
Section: Methodsmentioning
confidence: 99%