2004
DOI: 10.1063/1.1794357
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Electrical and structural properties of MgB2 films prepared by sequential deposition of B and Mg on the NbN-buffered Si(100) substrate

Abstract: We introduce a simple method of an MgB 2 film preparation using sequential electron-beam evaporation of B-Mg two-layer (followed by in-situ annealing) on the NbN buffered Si (100)

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Cited by 7 publications
(11 citation statements)
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References 13 publications
(17 reference statements)
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“…1, dashed line) under the same fabrication procedure. The X-ray and transmission electron microscope analyses showed polycrystalline character of the films grown on NbN/Si substrate and no Mg 2 Si or MgO were detected [3]. On the one hand NbN allows to increase T C0 of MgB 2 , but on the other hand it brings additional superconducting transition at lower temperatures (below 10-12 K), as it is seen in Fig.…”
Section: Resultsmentioning
confidence: 88%
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“…1, dashed line) under the same fabrication procedure. The X-ray and transmission electron microscope analyses showed polycrystalline character of the films grown on NbN/Si substrate and no Mg 2 Si or MgO were detected [3]. On the one hand NbN allows to increase T C0 of MgB 2 , but on the other hand it brings additional superconducting transition at lower temperatures (below 10-12 K), as it is seen in Fig.…”
Section: Resultsmentioning
confidence: 88%
“…The B-Mg bilayer was annealed in-situ for 10 min at 720 • C in Ar atmosphere of 16 Pa pressure. Further details of the in-situ MgB 2 thin film processing are described elsewhere [3,5]. A photoresis mask and Ar ion beam etching with ion energy of 400 eV for patterning of the microstrips were used.…”
Section: Methodsmentioning
confidence: 99%
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