The MgB2 superconducting thin films were prepared on NbN buffered Si(100) substrate by e-beam sequential evaporation. An in-situ fabrication process allows to prepare polycrystalline (with grain size ≈ 10 nm) MgB 2 thin films with a maximum zero resistance critical temperature as high as 36 K. The normal state and superconducting transport properties of these films as well as patterned microstrips (width 10 -30 µm, length 10 -30 µm) have been studied. Results following from temperature dependences of critical current density and current-voltage characteristics show that a flux-creep is responsible for critical current limitation in these microsptrips.