Electrical and dielectric characterization of Ge quantum dots embedded in MIS structure (AuPd/SiO2:Ge QDs/n-Si) grown by MBE

Alenizi, Maha A.; Aouassa, Mansour; Bouabdellaoui, Mohammed; Saron, K.M.A.; Aladim, A.K.; Ibrahim, Mohammed; Berbezier, Isabelle

doi:10.1016/j.physb.2024.415962

Physica B: Condensed Matter

2024

DOI: 10.1016/j.physb.2024.415962

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Electrical and dielectric characterization of Ge quantum dots embedded in MIS structure (AuPd/SiO2:Ge QDs/n-Si) grown by MBE

Maha A. Alenizi,

Mansour Aouassa,

Mohammed Bouabdellaoui

et al.

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Electrical and dielectric characterization of Ge quantum dots embedded in MIS structure (AuPd/SiO2:Ge QDs/n-Si) grown by MBE

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References 65 publications

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