2023
DOI: 10.1021/acsaelm.3c00034
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Electric-Field-Induced Metal Filament Formation in Cobalt-Based CBRAM Observed by TEM

Abstract: Conductive-bridging random access memory (CBRAM) using a cobalt (Co) electrode has recently featured a CMOS-compatible process, excellent data retention, and a sub-μA operating current level, which are difficult to achieve by conventional CBRAM. However, the resistive switching (RS) mechanism of Co CBRAM has not been extensively explored compared to that of the conventional CBRAM cells using Ag, Cu, or Ni as active metal electrodes. Because only implicit inferences based on electrical measurements have been ma… Show more

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Cited by 5 publications
(2 citation statements)
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“…They quantified the best-performing electrode material using the Gibbs free energy of formation which was found to have an optimal value slightly above 0 kJ mol −1 . Other factors like alloyed metal electrodes [ 38 ] and the effect of electromigration [ 39 ] have also been reported in recent literature.…”
Section: Resistive Switchingmentioning
confidence: 99%
“…They quantified the best-performing electrode material using the Gibbs free energy of formation which was found to have an optimal value slightly above 0 kJ mol −1 . Other factors like alloyed metal electrodes [ 38 ] and the effect of electromigration [ 39 ] have also been reported in recent literature.…”
Section: Resistive Switchingmentioning
confidence: 99%
“…ITO has been extensively researched and widely used as transparent electrodes in solar cells because of its wide bandgap (3.98 eV). [24][25][26][27] Therefore, ITO was utilized in this study to ensure transparency. However, when used as a single layer, ITO cannot block light in the IR range.…”
mentioning
confidence: 99%