2007
DOI: 10.1063/1.2771375
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Electric field distribution on knife-edge field emitters

Abstract: Conformal mapping is used to calculate the electric field on a knife-edge cathode, modeled as a rectangular ridge on a flat surface. It is found that the field enhancement factor scales approximately as the square root of the height-to-width ratio of the knife edge. A simple analytic approximation for the divergent electric field in the immediate vicinity of the sharp edge is derived. When a smaller knife edge is placed on top of a larger one, both assumed to have large height-to-width ratios, the composite fi… Show more

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Cited by 91 publications
(70 citation statements)
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“…We postulate that such a high value of field enhancement factor is due to microscopic features presence on the emitting surface of the field emitter, which dominates the emission. As explained by R. Miller et al, 29 the overall effective field enhancement factor of the emitter is multiplicative when the emission site is small compared to the supporting structure. 29,30 Figure 2 shows the I-V curves for four different configurations: A.)…”
Section: -5mentioning
confidence: 91%
See 1 more Smart Citation
“…We postulate that such a high value of field enhancement factor is due to microscopic features presence on the emitting surface of the field emitter, which dominates the emission. As explained by R. Miller et al, 29 the overall effective field enhancement factor of the emitter is multiplicative when the emission site is small compared to the supporting structure. 29,30 Figure 2 shows the I-V curves for four different configurations: A.)…”
Section: -5mentioning
confidence: 91%
“…As explained by R. Miller et al, 29 the overall effective field enhancement factor of the emitter is multiplicative when the emission site is small compared to the supporting structure. 29,30 Figure 2 shows the I-V curves for four different configurations: A.) two-fiber linear arrays with 500 µm separation, B.)…”
Section: -5mentioning
confidence: 91%
“…For a protruding ridge as may likely exist on the surface of an emitting cathode, the field enhancement factor can easily be obtained through conformal mapping techniques. 22,23 Details have been discussed by our group 24,25 and field enhancements by factors in excess of 10 3 shown to result for an emitter height of 10 µm and a 20 nm width. Furthermore, the presence of an ion (whether due to a separate material ejection and its subsequent ionization, or in the plasma surrounding the cathode), would alter the surface electric fields and lower the barrier for electron tunneling.…”
Section: Model Analysismentioning
confidence: 99%
“…14, 15 The enhanced power loss due to surface and interface roughness exerts significant effects on signal integrity of microelectronic circuits. [16][17][18][19][20] Other effects due to surface roughness, such as local electric and magnetic field enhancements, may trigger RF-breakdown 5,8,11,[19][20][21][22][23] and abrupt quenching 2,7,9 (i.e., rapid loss of superconductivity) of a superconducting cavity.…”
Section: Introductionmentioning
confidence: 99%