Electric field and tip–surface interaction dependence in nanopattern deposition by electropulsed scanning probe microscopy

Melo, L.V.; Delgado, Felipe S.; Brogueira, P.

doi:10.1016/j.msec.2005.06.045

Cited by 1 publication

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“…It would seem that direct deposition of the nanoparticles on an insulating substrate should be the easiest method and field evaporation of gold and other materials from an atomic force microscope (AFM) tip has been investigated by numerous researchers [73][74][75][76][77][78][79] on both semiconducting and insulating surfaces. The common factor is a negatively biased AFM tip yielding 1-4 nm thick deposits of 15 nm and 21 nm minimum diameter on silicon [73,74] with similar results on SiO 2 (on Si) [75,76]. The method is slightly varied in [78] where a side counter electrode is deposited on the SiO 2 surface instead of using the Si substrate as a back gate electrode which relies on the leakage current through the SiO 2 .…”

Section: Afm and Similar Techniquesmentioning

confidence: 99%

Electron transport in discontinuous metal thin films

Morris

2022

Nano Ex.

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The structure and basic experimental electrical properties of vacuum evaporated discontinuous (island) metal thin films of discrete metal nanoparticles on insulating substrates are briefly reviewed. Then the widely accepted Neugebauer and Webb (N&W) electrostatically activated electron tunneling conduction model is covered (with enhancements) before the numerous discrepancies between this model and experimental observations are identified, e.g. minimal substrate bias effect, non-linear field distribution, anomalous AC effects, asymmetrical contact effects, and switching. A modified model, based on contact electron injection and extraction, and computer simulations are introduced which explain these discrepancies at a qualitative level. However, quantitative experimental verification of the model is not possible without stable, reproducible films of known structures. The paper concludes with a review of possible preparation techniques which could yield satisfactory samples, especially self-assembly of organically protected metal nanoparticles. One of these has already demonstrated electrostatically activated conduction.

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Section: Afm and Similar Techniquesmentioning

confidence: 99%

Electron transport in discontinuous metal thin films

Morris

2022

Nano Ex.

View full text Add to dashboard Cite

show abstract

Electric field and tip–surface interaction dependence in nanopattern deposition by electropulsed scanning probe microscopy

Cited by 1 publication

References 6 publications

Electron transport in discontinuous metal thin films

Electron transport in discontinuous metal thin films

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