1998
DOI: 10.1103/physreva.57.1798
|View full text |Cite
|
Sign up to set email alerts
|

Elastic collisions of low- to intermediate-energy electrons from carbon dioxide: Experimental and theoretical differential cross sections

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

15
101
0

Year Published

2001
2001
2020
2020

Publication Types

Select...
9
1

Relationship

4
6

Authors

Journals

citations
Cited by 105 publications
(116 citation statements)
references
References 46 publications
15
101
0
Order By: Relevance
“…The two electron spectrometers used in the present work have been described thoroughly in previous publications (e.g., Tanaka et al 30,31 and Kato et al, 24 respectively). Generally speaking, both spectrometers employed are identical apparatus except for the following arrangements.…”
Section: Methodsmentioning
confidence: 99%
“…The two electron spectrometers used in the present work have been described thoroughly in previous publications (e.g., Tanaka et al 30,31 and Kato et al, 24 respectively). Generally speaking, both spectrometers employed are identical apparatus except for the following arrangements.…”
Section: Methodsmentioning
confidence: 99%
“…The present experiments were performed with two electron spectrometers that have been described in detail in previous papers (e.g., Tanaka et al 49 and Kato et al 46 ). Briefly, in both systems, the main features are a crossed electronmolecular beam arrangement, incorporating hemispherical monochromators and analyzers, electron lens systems with computer-driven voltages, and differential pumping for the electron optics.…”
Section: Methodsmentioning
confidence: 99%
“…The new spectrometer is configured in a classic crossed-beam geometry 25 and consists of an electron gun with hemispherical monochromator, an effusive molecular beam source ͑single capillary of length 6.5 mm and inner diameter 0.5 mm͒, and a rotatable scattered electron detector ͑angular range= −10°to 150°͒ with a second hemispherical analyzer system and a channel electron multiplier detector. Both the electron source and electron analyzer contain a number of aperture-type electron optic elements, which transport and focus the incident and scattered electrons.…”
Section: Methodsmentioning
confidence: 99%