2019
DOI: 10.1016/j.nimb.2019.06.025
|View full text |Cite
|
Sign up to set email alerts
|

Elastic backscattering as a method for the measurement of the integral lithium content in thin films on fusion-relevant substrates

Abstract: Different ion beam analysis techniques for the study of thin lithium-containing layers on top of fusion relevant materials are discussed and compared to each other. Elastic backscattering analysis (EBS) with protons is determined to be one of the most promising techniques and allows measurements of Li layers with thicknesses from ~100 nm up to ~600 μm, as shown by SIMNRA simulations. The best sensitivity for thin films (~100 nm) can be achieved using 4 MeV protons with 170° scattering detection angle for layer… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1

Citation Types

0
3
0

Year Published

2020
2020
2024
2024

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(3 citation statements)
references
References 61 publications
(107 reference statements)
0
3
0
Order By: Relevance
“…However, both require an experimentally obtained cross-section and such cross-sections are not always available. The EBS cross-section for H-Li has been recently measured at a similar angle as in our setup, [21], and it is widely used [22][23][24]. A drawback for EBS however is that, due to the low mass number of deuterium, the backscattered protons have low energy.…”
Section: Ebs Analysis and Nra Analysismentioning
confidence: 97%
“…However, both require an experimentally obtained cross-section and such cross-sections are not always available. The EBS cross-section for H-Li has been recently measured at a similar angle as in our setup, [21], and it is widely used [22][23][24]. A drawback for EBS however is that, due to the low mass number of deuterium, the backscattered protons have low energy.…”
Section: Ebs Analysis and Nra Analysismentioning
confidence: 97%
“…To measure small amounts of deposited material, Rutherford backscattering spectroscopy (RBS) was used [28]. The amount of material deposited on the experimental sample was about twice the amount of material deposited on the QMB crystal (1.90 ± 0.08 for Li).…”
Section: Qmb Calibrationmentioning
confidence: 99%
“…The amount of material deposited on the experimental sample was about twice the amount of material deposited on the QMB crystal (1.90 ± 0.08 for Li). It was shown also that the lateral distribution of W film was very uniform over the surface, while Li films became inhomogeneous after contact with air due to chemical reactions with atmospheric gases [28]. The calibration was repeated several times over a period of three years, and the ratio between the amount of material deposited on the experimental sample and the QMB crystal remained constant over that period of time.…”
Section: Qmb Calibrationmentioning
confidence: 99%