2009
DOI: 10.1016/j.mseb.2008.11.015
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Elaboration and characterization of Si(n)/PS/ZnO(n) structure obtained by rf-magnetron sputtering from aerogel nanopowder target material

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Cited by 11 publications
(7 citation statements)
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“…[10][11][12] Improvement of the optical and electrical properties of ZnO based thin films for optoelectronic devices have been widely investigated by different authors. Electrical resistivity values between 10 −3 and 10 −4 cm have been presented, [10][11][12][13][14][15][16] which are comparable to that of indium tin oxide (ITO) films. 17,18 Al-doped ZnO (AZO) has many advantages over ITO as a transparent conducting oxide (TCO), owing to its low cost, abundance, high thermal stability and absence of toxicity.…”
Section: Introductionmentioning
confidence: 99%
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“…[10][11][12] Improvement of the optical and electrical properties of ZnO based thin films for optoelectronic devices have been widely investigated by different authors. Electrical resistivity values between 10 −3 and 10 −4 cm have been presented, [10][11][12][13][14][15][16] which are comparable to that of indium tin oxide (ITO) films. 17,18 Al-doped ZnO (AZO) has many advantages over ITO as a transparent conducting oxide (TCO), owing to its low cost, abundance, high thermal stability and absence of toxicity.…”
Section: Introductionmentioning
confidence: 99%
“…21 Several studies have been reported about AZO sputtering targets preparation and respective thin films deposition and characterization. [10][11][12][19][20][21][22][23][24][25][26] However, most of them are produced using micropowder composites obtained by mechanical grinding method and do not focus on the optimization of target properties. Studies correlating the properties of nanostructured composite powders, the sintering process of the targets and corresponding thin film properties are hardly found.…”
Section: Introductionmentioning
confidence: 99%
“…It was reported in this work that the electrical contact take place in the volume of the PS film, which improve the electroluminescence efficiency [22]. In our previous work we have presented the PS/ZnO:Al 3% junction as a promising solar cell [23]. This paper focuses on the electrical characterization and the photovoltaic parameters of solar cell based on n-IZO/p-PS heterostructure.…”
Section: Introductionmentioning
confidence: 98%
“…The most promising thin films seem to be the In-doped zinc oxide thin films, with a V oc = 0.71 V, J sc = 1.18 mA/cm 2 and FF = 0.52 photovoltaic parameters for amorphous silicon solar cells, comparing to Voc = 0.49 V, Jsc = 0.94 mA/cm 2 and a fill factor parameter about 0.39 with ZnO:Al thin layer. And V oc = 0.52 V, J sc = 0.11 mA/cm 2 and FF = 0.42 for ZnO:Ga. We have presented in an earlier works the electrical study of a ZnO:Al/PS/Si structure [14].…”
Section: Introductionmentioning
confidence: 99%