Phys. Bl.
 1946
DOI: 10.1002/phbl.19460020205
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Ein Massenspektrometer zur chemischen Analyse/Fluoreszenzmethode zur Prüfung auf undichte Stellen/Zwei Verfahren zur übermikroskopischen Abbildung von Oberflächen/Elektrische Messung der Verformung von Oberflächen/Induktionsheizung bei der Weißblechherstellung/Metallvergütung mit Kurzwellen

John A. Hutcheson1,
Francis I. Catlin2,
V. K. Zworykin3
et al.
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