Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing
Riaz-ul-haque MIAN,
Tomoki NAKAMURA,
Masuo KAJIYAMA
et al.
Abstract:Wafer-level performance prediction techniques have been increasingly gaining attention in production LSI testing due to their ability to reduce measurement costs without compromising test quality. Despite the availability of several efficient methods, the site-to-site variation commonly observed in multi-site testing for radio frequency circuits remains inadequately addressed. In this manuscript, we propose a wafer-level performance prediction approach for multi-site testing that takes into account the site-to… Show more
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